Carbon Materials Analysis with Raman & XPS

Graphene and graphene-based materials such as graphene oxide, have impressive electrical, mechanical, chemical, and thermal properties. Development of new graphene-based products requires material characterization and analysis from the initial research stages through testing of the finished devices. Most materials need to be analyzed for compositional homogeneity across the sample surface and thickness through the sample. A complementary approach guides synthetic methods, material processing, and interrogating advanced composites containing these materials. Raman and X-ray photoelectron spectroscopy (XPS) can be used to gain insight into graphene-based materials and their properties such as structural uniformity, film quality, degree of functionalization, and electrical properties.

Stay up to date with the latest Raman and XPS information for carbon analysis.

X-ray Photoelectron Spectroscopy (XPS) enables the determination of the surface chemistry, and the way in which that chemistry changes in the surface and near-surface region. XPS provides quantitative elemental and chemical information with extremely high surface specificity (from outer 10 nm of the sample). Depth profiling extends the technique measuring this film layers.

XPS is ideal for comprehensively and quantitatively characterizing the composition and chemical bonding states at surfaces and interfaces.

• Determination of layer thickness
• Presence or absence of defects
• Measuring local strain on a sample.

Thermo Scientific™ DXR™ Raman products:

• Considerably reduce time in setting up, repeating measurements and applying the results
• Have high reproducibility and unparalleled control of critical measurement parameters for confidence in your results
• Are highly flexible, accommodating a wide variety of applications and sample forms.