Scientific Poster

Hard X-ray Photoelectron Spectroscopy for Multi-Layer Semiconductor Samples

Hard X-ray Photoelectron Spectroscopy for Multi-Layer Semiconductor Samples

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Presentation

Monatomic and Cluster Argon Ion XPS Depth Profiling of SrTiO3 and HfO2

Hard X-ray Photoelectron Spectroscopy for Multi-Layer Semiconductor Samples

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Presentation

Design of Integrated XPS/Raman Spectroscopy Instrument for Co-Incident Analysis

The Design of An Integrated XPS/ Raman Spectroscopy Instrument for Co-Incident Analysis

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