Pushing the Limits of EDS X-ray Detection
Light Element Analysis for Advanced Materials
Jul 25, 2017
- Jul 25, 2017
EDS X-ray detector technology has seen several improvements in the past years, starting with introduction of the silicon drift detector (SDD). Since then, manufacturers have made several improvements to the SDD. We are now to the point where examining light elements such as boron and beryllium is routine.
In this recorded presentation, we look at the factors that go into utilizing the latest EDS detector technology for light element work. This is essential in analyzing boron glass, certain refractory materials and many nanotechnologies. We will also discuss how lithium can be mapped with today's SEM/EDS instrumentation.
If you are looking to replace your old EDS detector or looking to install a new electron microscope, this presentation will shed valuable light on making the right choice with regard to your EDS detector.
Register today to watch this on demand presentation and learn more about the latest EDS detector technology for light element work.