Big discoveries from tiny particles
Nanomaterials are defined as having at least one dimension that measures 100 nanometers or less – given that a nanometer is one millionth of a millimeter, it takes special tools to work with any material on that scale.
In nanotechnology, researchers examine materials that incorporate both organic and inorganic compounds such as OLEDs. Two powerful tools for nanomaterial analysis are Raman spectroscopy and X-ray photoelectron spectroscopy, both of which can probe layers of inorganic and organic materials.
XPS is a major technique for thin film and ultra-thin film analysis. It is useful in characterizing monolayer coatings of nanoparticles. By adding cluster ion source sputtering, it can be also used to profile layers of polymeric and metallic materials.
Raman is useful in characterizing spatial distribution and phase homogeneity of materials as well as crystalline structures and molecular orientation. It is particularly useful in analysis of carbonaceous materials such as graphene.
Twin-screw extruders provide a well-established method of mixing, compounding and processing viscous materials. The equipment is highly flexible and easily customized for a specific task such as a small scale lab extruder that saves waste when analyzing precious or expensive components.
Featured nanomaterial analysis videos
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Discovery of possible uses for graphene has only just begun
Graphene, a single thin layer of carbon atoms arranged in a honeycomb pattern, has only been isolated and explored as a new material within the last six years. Many possibilities for this amazing new material remain unexplored.
- Stronger than steel
- Practically transparent
- A great conductor of heat and electricity
- So thin it’s considered 2-dimensional
Good materials characterization is required at all steps in the creation of new graphene devices, from guiding the initial graphene synthesis and transfer to the desired substrate, to chemical modification and analysis of the finished device. A multi-technique approach using both Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) can address the challenges posed at these steps.
Raman spectroscopy and XPS can be used as complementary techniques for full characterization of graphene-based samples. Raman provides information on molecular structure, morphology and film quality, stress, and layer thickness. XPS can provide chemical quantification, impurity identification, layer thicknesses, and depth composition variations.
To learn more, visit Carbon Materials Analysis with Raman and XPS ›