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Enable nanoscale imaging with the Phenom Pharos G2 Desktop FEG-SEM
The Thermo Scientific Phenom Pharos G2 Desktop FEG-SEM helps you analyze small particles at high resolution, all from the comfort of an office environment. It can help you image nanoparticles, imperfections in coatings, and various other nanometer-sized features that would simply be missed by other desktop or tungsten SEMs.
Long-lasting FEG source for high-resolution, stability, and high-precision imaging
A field emission gun (FEG) electron source offers outstanding image quality with enhanced resolution and contrast. These advanced electron sources boast impressive longevity, significantly surpassing the lifespan of traditional tungsten filaments by an order of magnitude.
FEG sources provide a stable electron beam with minimal degradation over time, eliminating the abrupt failures often associated with tungsten filaments.
This stability allows for consistent performance and makes it possible to schedule maintenance and replacements during routine service intervals, helping to ensure uninterrupted operation and optimal imaging results.
Image of diatoms captured with the Phenom Pharos G2 Desktop FEG-SEM.
Just one hour of training needed
To use the Phenom Pharos G2 Desktop FEG-SEM effectively, all you need is a desk and less than one hour of training. Now you can open up the world of high-end FEG-SEM analysis to everyone—from lab researchers to graduate students—so you and your organization can get more from your microscope.
An ideal choice for beam-sensitive samples
Thanks to its FEG source, the Phenom Pharos G2 Desktop FEG-SEM enables imaging at acceleration voltages down to 1 kV, providing high-resolution and high-quality imaging of a wide range of materials, including polymers. Its low kV imaging capabilities make it possible to image beam-sensitive materials without the need to apply a coating while also imaging nanoscale surface features.
Pharmaceutical powder captured at 1 kV, 2 kV, 5 kV, 10 kV, and 20 kV using the Phenom Pharos G2 Desktop FEG-SEM.
Desktop FEG SEM built for your biggest imaging and analysis needs
Two of the biggest obstacles traditionally faced by industrial lab managers looking to introduce FEG-SEM technology is the size and complexity of these systems. They take up valuable space and they take a long time to master. The Phenom Pharos G2 Desktop FEG-SEM was developed specifically as a walk-up system that supports your continuing quest for greater ease of use and productivity.
Phenom Pharos G2 Desktop FEG-SEM technical specifications
| Phenom Pharos G2 Desktop FEG-SEM | |
| Sample size |
Up to 25 mm diameter (optional 35 mm and 100 mm (h) available) |
| Source type |
Schottky field emission source |
| Max. resolution |
<2.0 nm |
| Detectors and signals |
|
| Software options and accessories |
|
| Footprint |
92.5 (w) 305.6 (d) 343.5 (h) mm, 83.8 kg |
| Acceleration voltage range |
1 to 20 kV |
| Low vacuum mode (stating pressure ranges) | 0.1 Pa – 1 Pa – 60 Pa |
Frequently asked questions about the Phenom Pharos G2 Desktop SEM
FEG-SEM instruments, like the Phenom Pharos G2 Desktop SEM, use a long-lifetime field emission gun as the electron source, which generates a stable, high-brightness beam that enables imaging at acceleration voltages as low as 1 kV. This supports high-resolution and high-quality imaging of a wide range of materials, including polymers.
The Phenom Pharos G2 Desktop SEM is capable of imaging particles, coatings, polymers, fibers, and other beam-sensitive or insulating materials. Thanks to the FEG-SEM, it can examine nanoscale structures without damaging delicate specimens.
The Phenom Pharos G2 Desktop SEM features a user-friendly interface that helps most new users operate the microscope effectively with less than an hour of training, making advanced SEM imaging more accessible to both researchers and students.
The Phenom Pharos G2 Desktop SEM supports an accelerating voltage range from 1 kV to 20 kV, enabling fine-scale imaging of beam-sensitive samples at low voltage, along with detailed structural analysis at higher voltages.
Yes. With low-kV imaging capability down to 1 kV, this desktop SEM allows for the high-quality imaging of beam-sensitive and insulating samples without the need for conductive coatings; this preserves surface detail and morphology.
The Phenom Pharos G2 Desktop SEM is capable of revealing fine nanoscale details, making it a powerful tool for the analysis of nanoparticles, sample surface features, and subtle material differences that are not visible with lower-resolution scanning electron microscopy.
Optional detectors for the Phenom Pharos G2 Desktop FEG-SEM include a high-sensitivity backscattered electron detector for compositional contrast, a secondary electron detectors for surface detail, and an energy dispersive X-ray spectroscopy detector for elemental analysis.
The Phenom Pharos G2 Desktop FEG-SEM is used for materials characterization, nanoparticle analysis, defect inspection, coatings evaluation, microstructural imaging, and other nanoscale investigations across materials science, electronics, pharmaceuticals, and more.
Desktop FEG-SEM instruments, like the Phenom Pharos G2 Desktop SEM, offer field emission SEM imaging with a compact tabletop footprint. This instrument features a rapid sample-to-image workflow that is easy to use, while also having minimal infrastructural requirements. This makes high-quality SEM imaging more accessible and cost-effective for a wider range of users and labs.
For Research Use Only. Not for use in diagnostic procedures.