Chris Calam spent over 26 years at Thermo Fisher Scientific, focused on optical emission, X-Ray fluorescence and diffraction, X-ray for electron microscopes across the UK, in the industrial, research and academia markets.
Strombotne, Tom
Tom Strombotne has been with Thermo Fisher Scientific as a product manager and product applications specialist in the minerals analysis industry for over a decade. His skills include development and application of on-line elemental, particle size analyzers and samplers for process control and metallurgical accounting in wet and dry mineral beneficiation processes. Technologies include XRF, PGNAA, RF and Ultrasonic Scattering.
Chuang, Chien-Chin
Chien-Chin Chuang (known as “CC”) spent over 5 years at Thermo Fisher Scientific as the
Sen, Abhijit
Dr. Abhijit Sen earned his Bachelor’s degree in Chemistry honors from Ramakrishna Mission Residential College, Narendrapur, Kolkata, India. He subsequently completed his M.S. and Ph.D. in Materials Science at the Jawaharlal Nehru Centre for Advanced Scientific Research (JNCASR), Bangalore. His doctoral research focused on structure–property relationships in organic-inorganic halide hybrids, involving the design and synthesis of zero- to three-dimensional hybrid crystals and the study of their dimension-dependent dielectric, optical, and magnetic properties.
Following his Ph.D., Dr. Sen worked as a Research Engineer III at Saint-Gobain Research India for two years. There, he contributed to new product development, root cause analysis, failure mode and effects analysis (FMEA), and competitive benchmarking using sophisticated tools e.g. XRD, microscopes, XRF, TGA, DSC etc.
Currently, he serves as an Application Scientist at Thermo Fisher Scientific India, overseeing XRF, OES, and XRD application support across India and neighboring regions. As a materials chemist, Dr. Sen possesses a deep understanding of the structure–property relationships in ceramics, metals, organics, and hybrid materials. He brings practical expertise in a wide range of analytical techniques, including SEM, XRD, XRF, XPS, optical microscopy, UV-Vis, PL, FTIR, TGA, DSC, and dielectric and magnetic measurements, to support both research and QA/QC applications.
Bonvin, Didier
For over 30 years, Didier Bonvin has been a product and applications manager with a focus on XRF and X-ray technologies.