Multiscan Metal Detector Technology to Be Presented at PACK EXPO

Metal detectors have been an important safety tool in the food industry. These systems provide reliable, cost-effective protection from even the smallest metal contaminants found anywhere in a food-production process. It is not uncommon for pieces of mesh screen or broken-off parts from metal food processing equipment to find their way into packaged foods. Food metal detectors are one of the ways that food processors help ensure only quality metal-free food products are being shipped to consumers.

How do food grade metal detectors work? Metal detectors find small particles of ferrous, non-ferrous and stainless steel using coils wound on a nonmetallic frame and connected to a high-frequency radio transmitter. When a particle of metal passes through the aperture, the electromagnetic field is disturbed under one coil, changing the output signal by a few microvolts. The output is used as an indicator that metal is present.

Since the invention of the digital metal detector over 25 years ago, these instruments have used a limited number of frequencies (e.g., one or two simultaneously) to ensure that any type, size or shape of metal can be detected anywhere inside both dry and conductive/magnetic or “wet” products. The goal has been to pick the best frequency to ensure 100% detection. Unfortunately, this is a compromise because there is no ideal frequency to detect anything anywhere in any product. The result in sensitivity is impacted, leading to unpleasant and costly escapes.

There is a new technology on the horizon that is a completely new approach to metal detection, where the critical control point (CCP) scans up to five completely adjustable frequencies to find metal types and sizes previously undetectable. Using a true broad-spectrum approach reduces the probability of an escape by many orders of magnitude. This new technology is analogous to having up to five metal detectors back to back in a production line.

Our expert in food metal detection systems, Bob Ries, will be giving a presentation about this new technology at this year’s PACK EXPO, which is being held in Las Vegas on September 25–27, 2017. He will be on the PACK EXPO Innovation Stage C-1049 on Wednesday, September 27 at 10 a.m., explaining metal detection basics for newcomers to the area; he will describe the multiscan concept and give several examples showing dramatic performance improvements. Additionally, signal processing and electronics improvements will be highlighted as they pertain to a new level of performance. Finally, all important data reporting and problem diagnosis capabilities will be discussed.

If you miss his presentation, Bob Ries will be with other product inspection experts in Booth C-2200, demonstrating the latest innovations in checkweighing, metal detection and X-ray inspection. These are the types of technologies that can help ensure the safety and quality of your packaged and unpackaged products.

We don’t want you to miss this event, so you are invited to be our guest at the show. You can obtain a free pass by following the instructions on our PACK EXPO event page. You can also join our email list for updates on our PACK EXPO activities, product news, special offers and more.

If you can’t make it to the show, visit our PACK EXPO event page to join our email list for updates on our PACK EXPO activities, product news, special offers and more. Follow the show’s Twitter posts @packexposhow using #PACKEXPO or visit the show’s Facebook page.

Hope to see you there!

Show details:

PACK EXPO

Innovation Stage, C-1049
Wednesday, September 27, at 10 a.m.

Las Vegas Convention Center
Booth C-2200
September 25–27, 2017
Las Vegas, Nevada USA

Free pass available on our PACK EXPO event page