{"id":4952,"date":"2015-07-30T08:00:07","date_gmt":"2015-07-30T12:00:07","guid":{"rendered":"http:\/\/admin.acceleratingscience.com\/?p=4952"},"modified":"2026-04-10T13:53:04","modified_gmt":"2026-04-10T18:53:04","slug":"technology-focus-silicon-drift-detectors-2","status":"publish","type":"post","link":"https:\/\/www.thermofisher.com\/blog\/materials\/technology-focus-silicon-drift-detectors-2\/","title":{"rendered":"Technology Focus: Silicon Drift Detectors"},"content":{"rendered":"

\"siliconModern Silicon Drift Detectors (SDDs) typically outperform lithium drifted silicon, or Si(Li) detectors and have become the current state-of-the-art for high resolution, high count rate X-ray spectroscopy. Recent developments in SDDs have improved the detection efficiency of energy-dispersive spectroscopy (EDS).<\/p>\n

EDS paired with scanning electron microscope (SEM) evaluation is an excellent testing methodology for polymer analysis including failure analysis, identification of contaminants or residues, and elemental composition analysis.<\/p>\n

Read the Advancing Mining post, Technology Focus: Silicon Drift Detectors<\/a><\/em>, to learn more about the advantages of SDDs.<\/p>\n

 <\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

Modern Silicon Drift Detectors (SDDs) typically outperform lithium drifted silicon, or Si(Li) detectors and have become the current state-of-the-art for high resolution, high count rate X-ray spectroscopy. Recent developments in SDDs have improved the detection efficiency of energy-dispersive spectroscopy (EDS). EDS paired with scanning electron microscope (SEM) evaluation is an excellent testing methodology for polymer<\/p>\n","protected":false},"author":156,"featured_media":5339,"comment_status":"open","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_kad_blocks_custom_css":"","_kad_blocks_head_custom_js":"","_kad_blocks_body_custom_js":"","_kad_blocks_footer_custom_js":"","_monsterinsights_skip_tracking":false,"_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":"","footnotes":""},"categories":[967,958,963],"tags":[955],"division":[],"class_list":{"0":"post-4952","1":"post","2":"type-post","3":"status-publish","4":"format-standard","5":"has-post-thumbnail","7":"category-energy-dispersive-x-ray-spectroscopy","8":"category-failure-analysis","9":"category-scanning-electron-microscopy","10":"tag-polymer-plastics","11":"entry"},"_selected_authors":[1353],"_selected_reviewers":[],"acf":[],"yoast_head":"\nTechnology 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content=\"https:\/\/www.thermofisher.com\/blog\/materials\/technology-focus-silicon-drift-detectors-2\/\" \/>\n<meta property=\"og:site_name\" content=\"Advancing Materials\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/thermofisher\" \/>\n<meta property=\"article:published_time\" content=\"2015-07-30T12:00:07+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-04-10T18:53:04+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/admin.acceleratingscience.com\/materials\/wp-content\/uploads\/sites\/7\/2015\/07\/driftdesign.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"466\" \/>\n\t<meta property=\"og:image:height\" content=\"295\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Keith Thompson\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@thermofisher\" \/>\n<meta name=\"twitter:site\" 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