{"id":5889,"date":"2015-10-22T08:00:13","date_gmt":"2015-10-22T12:00:13","guid":{"rendered":"http:\/\/admin.acceleratingscience.com\/?p=5889"},"modified":"2026-04-15T08:09:50","modified_gmt":"2026-04-15T13:09:50","slug":"new-xps-ion-source-tests-polymer-based-materials","status":"publish","type":"post","link":"https:\/\/www.thermofisher.com\/blog\/materials\/new-xps-ion-source-tests-polymer-based-materials\/","title":{"rendered":"New XPS Ion Source Tests Polymer-Based Materials"},"content":{"rendered":"<p><div style=\"width: 260px\" class=\"wp-caption alignright\"><img loading=\"lazy\" decoding=\"async\" src=\"http:\/\/admin.acceleratingscience.com\/wp-content\/uploads\/2015\/10\/magcisdualbeamionsourceforxpsinstruments7.png\" style=\"float: right;border: 0;margin: 10px\" alt=\"MAGCIS&trade; Dual Beam Ion Source for XPS Instruments\" title=\"MAGCIS&trade; Dual Beam Ion Source for XPS Instruments\" width=\"250\" height=\"175\" \/><p class=\"wp-caption-text\">MAGCIS\u2122 Dual Beam Ion Source for XPS Instruments<\/p><\/div>The September issue of <a href=\"http:\/\/mio.asminternational.org\/amp\/201509\/#28\"><em>Advanced Materials and Processes<\/em><\/a> published a technical spotlight on testing inorganic and organic materials with a new ion source.&nbsp; The <a href=\"http:\/\/www.thermoscientific.com\/en\/about-us\/events\/xps-simplified---xps-data-interpretation.html\">X-ray Photoelectron Spectroscopy<\/a> (XPS) technique <span>&ndash;<\/span>&nbsp;a widely used analysis technique which provides quantitative, chemical state information for surfaces and interfaces &ndash; was highlighted.<\/p>\n<p>Multi-layered materials, especially those used for components in the biomedical and energy industries, are commonly composed of polymer-based materials.&nbsp; The surfaces of these materials must be analyzed to understand the interactions of the layers with each other and the environment.&nbsp; Commonly used techniques <span>&ndash;<\/span>&nbsp;such as an XPS system fitted with an ion gun that produces monatomic argon ions to remove material from the surface <span>&ndash;<\/span>&nbsp;has some drawbacks.&nbsp; Polymeric systems can be chemically modified by interaction with an ion beam, thus changing the chemistry and the spectra obtained during depth profiling.&nbsp; So, to allow depth profiling of the polymer-based systems, gas cluster ion sources have been developed.<\/p>\n<p>Read the <a href=\"http:\/\/mio.asminternational.org\/amp\/201509\/#28\">article<\/a> to learn how a new monatomic and gas cluster <a href=\"http:\/\/www.thermoscientific.com\/en\/product\/magcis-dual-beam-ion-source-xps-instruments.html\" target=\"_blank\" rel=\"noopener\">ion source for XPS instruments<\/a> uses both Ar+ and Ar<sub><span>n<\/span><\/sub>+ (n&gt;1000) gas cluster sputtering to clean surfaces and create depth profiles for a growing class of polymer-based advanced materials.<\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>The September issue of Advanced Materials and Processes published a technical spotlight on testing inorganic and organic materials with a new ion source.&nbsp; The X-ray Photoelectron Spectroscopy (XPS) technique &ndash;&nbsp;a widely used analysis technique which provides quantitative, chemical state information for surfaces and interfaces &ndash; was highlighted. Multi-layered materials, especially those used for components in<\/p>\n","protected":false},"author":45,"featured_media":6230,"comment_status":"open","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_kad_blocks_custom_css":"","_kad_blocks_head_custom_js":"","_kad_blocks_body_custom_js":"","_kad_blocks_footer_custom_js":"","_monsterinsights_skip_tracking":false,"_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":"","footnotes":""},"categories":[959,962],"tags":[955],"division":[],"class_list":{"0":"post-5889","1":"post","2":"type-post","3":"status-publish","4":"format-standard","5":"has-post-thumbnail","7":"category-fundamental-materials-research","8":"category-x-ray-photoelectron-spectroscopy","9":"tag-polymer-plastics","10":"entry"},"_selected_authors":[1319],"_selected_reviewers":[],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v27.8 (Yoast SEO v27.8) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>New XPS Ion Source Tests Polymer-Based Materials<\/title>\n<meta name=\"description\" content=\"Read the article to learn how a new monatomic and gas cluster ion source for XPS instruments uses both Ar+ and Arn+ (n&gt;1000) gas cluster sputtering.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.thermofisher.com\/blog\/materials\/new-xps-ion-source-tests-polymer-based-materials\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"New XPS Ion Source Tests Polymer-Based Materials\" \/>\n<meta property=\"og:description\" content=\"Read the article to learn how a new monatomic and gas cluster ion source for XPS instruments uses both Ar+ and Arn+ (n&gt;1000) gas cluster sputtering.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.thermofisher.com\/blog\/materials\/new-xps-ion-source-tests-polymer-based-materials\/\" \/>\n<meta property=\"og:site_name\" content=\"Advancing Materials\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/thermofisher\" \/>\n<meta property=\"article:published_time\" content=\"2015-10-22T12:00:13+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-04-15T13:09:50+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/admin.acceleratingscience.com\/materials\/wp-content\/uploads\/sites\/7\/2015\/10\/magcisdualbeamionsourceforxpsinstruments7.png\" \/>\n\t<meta property=\"og:image:width\" content=\"250\" \/>\n\t<meta property=\"og:image:height\" content=\"176\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"author\" content=\"Carl D. 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