The International Metallographic Society (IMS) is involved in a wide range of events throughout the year, from technical meetings to social activities; and next week they will be joining the Microscopy Society of America, the Microanalysis Society, the Microscopical Society of Canada and the International Union of Microbeam Analysis Societies at the Microscopy & Microanalysis Annual Meeting (M&M 2014) in Hartford, Connecticut, USA.
IMS members are involved with materials and their fabrication, their performance and behavior, their analysis and evaluation, and the equipment needed to conduct these studies. According to the IMS website, of special interest to their members are techniques for microstructural examination, analysis and evaluation including light, electron and acoustical microscopy; quantitative/computer-aided microstructural analysis; metallography, ceramography and resinography; and allied sciences for physical and chemical analysis. So it seems M&M 2014 is a perfect place for members to learn the latest in microscopy and microanalysis techniques.
My colleagues and I will be in booth 427, demonstrating how electron microscopy plays a key role in the development, process and failure analysis of metals, metallic compounds and alloys due to its ability to example samples down to the nanometer scale. X-ray microanalysis provides elemental and chemical information about the sample to supplement the morphological information provided by the microscope.
Almost all companies that process, fabricate, functionalize or distribute metals own at least one scanning electron microscope with Energy-Dispersive X-ray Spectroscopy (EDS) X-ray microanalysis. New EDS detector technology enables electron microscopists to distinguish overlapping peaks in transition metals even when using low voltages, where L-lines are prone to energy conflicts. When fully integrated with WDS, this technology makes high spectral resolution analysis accessible to the everyday microscopist.
To continuously improve the analytical power of the microanalysis software in the characterization of metallic compounds and alloys, geological samples and semiconductor materials, a set of image filters are available which greatly improves confidence in the displayed data. Stop by our booth to see a demonstration of this new imaging filtering technology.
In addition, Thermo Fisher Scientific is a sponsor of the show and will be conducting a vendor symposium on “New Tools for Life and Materials Sciences” and a session on “Surface and Subsurface Microscopy and Microanalysis in Materials and Biological Systems.” Check the program schedule for event times and locations.
If you need to spend a few extra days away from the microscope, the show has provided a link to the Hartford/Connecticut Visitors Bureau for local information on tours and other visitor activities. Whether you’re into active adventures, arts and culture, family fun, or rest and relaxation, the website can guide you through the best getaway.
August 3 -7, 2014
Microscopy & Microanalysis 2014
Connecticut Convention Center
Hartford, CT, USA