Today, many researchers need fast information about the chemistry of their samples. Moreover, many work with materials sensitive to electron beams, making it difficult to obtain the data they need. The good news is that our new Dual-X detector solves both of these challenges.
To help researchers obtain faster 2D and 3D chemical information at lower doses on a wider range of samples, including beam-sensitive materials, we recently added two symmetrically positioned 100mm2 Racetrack detectors (Dual-X) to our Talos F200i scanning transmission electron microscope (S/TEM). This new feature addresses the difficulty of retrieving good quantitative data from non-symmetrical EDS arrangements and will allow scientists to characterize materials down to the (sub-)nanometer level in the fastest way.
The Dual-X detector was developed to deliver the highest analytical throughput, making it possible to perform energy-dispersive X-ray spectroscopy (EDS) analyses much faster than with previous EDS detectors. Large EDS maps can be generated in less than a minute.
Our high-speed Dual-X EDS detectors can be combined with the high-brightness X-FEG electron gun to maximize imaging and spectroscopy performance.
Dual-X detectors were used to produce this large-area, high-resolution EDS mapping of gold-nickel nanoparticles in less than one minute. (Sample courtesy J. Bursik, Institute of Physics of Materials, Brno)
Here are some of the benefits:
- Symmetrically positioned Dual-X enables the highest analytical throughput and chemical analysis at lower doses on a wider range of samples.
- Dual-X is embedded in our Velox Software, allowing users to easily acquire and analyze multimodal data for the most complete material characterization all in one tool.
- Unique EDS absorption correction in Velox Software enables the most accurate quantification. Regardless of sample orientation, users always have access to the most accurate elemental information.
- Dual-X is fully embedded and optimized for:
- Fast, automated, unattended EDS tomography for 3D EDS enables instant access to your data
- STEM and EDS Maps software for automated acquisition of statistically relevant data on large area images at high resolution. Data from different imaging and analysis modalities can easily be correlated including on-the-fly processing and statistics via Thermo Scientific Avizo software.
One of several EDS detectors configurable with the Talos, the Dual-X will be available starting this week. This new detector promises to help scientists answer questions that were previously unresolvable, taking automated 2D and 3D EDS to a new level.
Yuri Rikers is Talos product marketing manager at Thermo Fisher Scientific.