Terrestrial analogs to Martian geologic conditions are being employed in combination with data collected over the various Martian rover and satellite expeditions ongoing since the 1960’s to characterize the physiological and chemical properties of Mars.
Such materials are being used to study a wide range of topics, from general geochemistry to the potential for human missions to Mars.
X-ray diffraction (XRD) and X-ray Fluorescence (XRF) are considered to be gold standard methods for material analysis.
X-ray diffraction (XRD) is a versatile and nondestructive analytical technique that can quickly obtain detailed structural and phase information of materials. XRD analysis provides high-performance results in a wide range of industrial and research applications including metals and minerals. X-Ray Fluorescence (XRF) can help achieve rapid material characterization and analysis to ensure product chemistry specifications are met. X-Ray Fluorescence (XRF) technology enables accurate, nondestructive elemental analysis in a wide range of applications including cement, metals, petroleum and mining.
In the geologic sector, from mining to research, these two synergistic techniques have found many uses and applications. Modern applications in research, require fast and accurate instruments with limited downtime. Such improvements allow central laboratories to streamline data collection and analysis.
A sample of basalt collected from craters of the Moon National Monument, Idaho, USA was studied by grinding the bulk material and placing it in a reflection sample holder. The sample was analyzed from 0-115° 2θ under Co Kα (1.78897 Å) radiation for 30 minutes, with the sample rotating during the analysis to reduce the effects of preferred orientation.
Read about the experiment that utilized both XRD and XRF technology, including products used, measurement times, refined data, and results, in the application note. It outlines how when the two technologies are paired, a complete synergistic analysis of the alkaline basalt sample can be obtained.
- Read the application note: XRD and XRF investigation of Martian analog basalt from terrestrial craters