{"id":1390,"date":"2026-02-13T18:12:55","date_gmt":"2026-02-13T23:12:55","guid":{"rendered":"https:\/\/admin.acceleratingscience.com\/?post_type=contributor&#038;p=1390"},"modified":"2026-02-20T13:35:51","modified_gmt":"2026-02-20T18:35:51","slug":"prokhodtseva-anna","status":"publish","type":"contributor","link":"https:\/\/admin.acceleratingscience.com\/contributor\/prokhodtseva-anna\/","title":{"rendered":"Prokhodtseva, Anna"},"content":{"rendered":"<h2 style=\"font-size: 120%\"><strong>About Dr. Anna Prokhodtseva<\/strong><\/h2>\n<p>Dr. Anna Prokhodtseva is a Product Manager for FIB-SEM systems at Thermo Fisher Scientific. She has worked in electron microscopy for more than 15 years, with a technical foundation that includes focused ion beam methods, scanning electron microscopy, transmission electron microscopy, energy-dispersive spectroscopy, and electron backscatter diffraction. Her experience reflects deep engagement with the tools and techniques used to investigate material structure and behavior.<\/p>\n<h2 style=\"font-size: 120%\"><strong>Expertise and focus<\/strong><\/h2>\n<p>Anna has extensive hands-on experience preparing and analyzing samples for advanced imaging and microanalysis. During her doctoral research, she developed deep practical expertise using electron microscopy to study radiation damage and structural behavior in metals, including detailed work with transmission electron microscopy and focused ion beam techniques.<\/p>\n<p>Following her PhD, Anna held a series of technical roles at Thermo Fisher Scientific, where she contributed directly to the development of new FIB-SEM products through close collaboration with research and development teams. Her experience includes transmission electron microscopy lamella preparation, focused ion beam tomography, atom probe specimen preparation, and the use of analytical methods such as electron backscatter diffraction and energy-dispersive spectroscopy. She also has experience with image analysis tools used in materials characterization. These capabilities enable her to understand how researchers utilize microscopy to investigate microstructure, defects, interfaces, and compositional variations in complex materials.<\/p>\n<p>In her current role, Anna focuses on translating focused ion beam user needs into practical solutions that support real research challenges. This background allows her to understand how researchers use microscopy to study microstructure, defects, interfaces, and compositional variations in complex materials.<\/p>\n<h2 style=\"font-size: 120%\"><strong>Scientific perspective<\/strong><\/h2>\n<p>Anna\u2019s perspective is shaped by years of collaboration with research and development teams and by her doctoral work in radiation damage in metals, which required detailed structural and compositional evaluation using electron microscopy. She understands the practical challenges researchers face when imaging and analyzing various materials, preparing samples, and combining complementary techniques. Her goal is to support customers as they work to obtain accurate and meaningful insight from their FIB-SEM and transmission electron microscopy data.<\/p>\n","protected":false},"featured_media":1391,"template":"","meta":{"_acf_changed":false,"_kad_blocks_custom_css":"","_kad_blocks_head_custom_js":"","_kad_blocks_body_custom_js":"","_kad_blocks_footer_custom_js":"","_monsterinsights_skip_tracking":false,"_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":""},"expertise":[19,87,427,343,276,234,251],"class_list":{"0":"post-1390","1":"contributor","2":"type-contributor","3":"status-publish","4":"has-post-thumbnail","6":"expertise-backscattered-electron-and-secondary-electron-imaging","7":"expertise-dualbeam-fib-sem","8":"expertise-electron-microscopy","9":"expertise-focused-ion-beams","10":"expertise-materials-science","11":"expertise-scanning-electron-microscopy","12":"expertise-transmission-electron-microscopy","13":"entry"},"acf":{"first_name":"Anna","last_name":"Prokhodtseva","display_name":"Dr. Anna Prokhodtseva","credentials":"PhD in Physics, Plasma Physics Research Center, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne (EPFL)","job_title":"Product Manager","company":"Thermo Fisher Scientific","short_description":"Dr. Anna Prokhodtseva is a Product Manager for FIB-SEM systems with more than 15 years of experience in electron microscopy and materials characterization. Her background spans focused ion beam methods, scanning electron microscopy, transmission electron microscopy, and analytical techniques used to study structure and composition across a wide range of materials. 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