{"id":1442,"date":"2026-02-24T14:57:37","date_gmt":"2026-02-24T19:57:37","guid":{"rendered":"https:\/\/admin.acceleratingscience.com\/?post_type=contributor&p=1442"},"modified":"2026-02-24T14:57:37","modified_gmt":"2026-02-24T19:57:37","slug":"stokes-adam-biography","status":"publish","type":"contributor","link":"https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/","title":{"rendered":"Stokes, Adam"},"content":{"rendered":"

About Adam Stokes<\/strong><\/h2>\n

Adam Stokes is a Senior Product Marketing Manager with 13 years of experience in electron microscopy. His technical expertise centers on plasma focused ion beam (PFIB) techniques for advanced failure analysis, as well as millimeter-to-nanoscale device characterization and the identification of critical microstructure\u2013property relationships. He holds a PhD in Materials Science from the Colorado School of Mines.<\/p>\n

Expertise and focus<\/strong><\/h2>\n

Adam\u2019s expertise centers on PFIB workflows used in semiconductor failure analysis and advanced device characterization. His background includes large volume material removal, cross sectioning, advanced lamella preparation, and three-dimensional analysis applied to complex semiconductor structures. He has worked with a range of preparation techniques that support downstream analysis such as transmission electron microscopy and atom probe tomography, enabling detailed investigation of defects, interfaces, and process-related variations in semiconductor devices.<\/p>\n

Scientific perspective<\/strong><\/h2>\n

Adam\u2019s scientific perspective is shaped by his doctoral research in materials science together with his ongoing engagement with semiconductor characterization challenges. He understands how plasma focused ion beam methods can be used to access buried features and complex architectures at relevant length scales, and how these capabilities support yield learning, process development, and device reliability analysis. His work reflects a focus on connecting advanced preparation and analysis techniques with the evolving needs of semiconductor technology development.<\/p>\n","protected":false},"featured_media":1443,"template":"","meta":{"_acf_changed":false,"_kad_blocks_custom_css":"","_kad_blocks_head_custom_js":"","_kad_blocks_body_custom_js":"","_kad_blocks_footer_custom_js":"","_monsterinsights_skip_tracking":false,"_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":""},"expertise":[104,203,237],"class_list":{"0":"post-1442","1":"contributor","2":"type-contributor","3":"status-publish","4":"has-post-thumbnail","6":"expertise-failure-analysis","7":"expertise-plasma-focused-ion-beam","8":"expertise-semiconductor","9":"entry"},"acf":{"first_name":"Adam","last_name":"Stokes","display_name":"Dr. Adam Stokes","credentials":"PhD in Materials Science from the Colorado School of Mines","job_title":"Senior Product Marketing Manager","company":"Thermo Fisher Scientific","short_description":"Adam Stokes is a Senior Product Marketing Manager with 13 years of experience in electron microscopy. His technical expertise centers on plasma focused ion beam (PFIB) techniques for advanced failure analysis, as well as millimeter-to-nanoscale device characterization and the identification of critical microstructure\u2013property relationships. He holds a PhD in Materials Science from the Colorado School of Mines.","education":"","email_address":"","linkedin_profile":"","x_profile":"","external_link":"","headshot":1443,"accomplishments":"","publications":null,"recognitions":null,"certifications":null},"yoast_head":"\nAdam Stokes Biography on Accelerating Science<\/title>\n<meta name=\"description\" content=\"Adam Stokes is an expert in semiconductor electron microscopy with expertise in PFIB failure analysis, device characterization, and more.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.thermofisher.com\/blog\/contributor\/stokes-adam-biography\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Stokes, Adam\" \/>\n<meta property=\"og:description\" content=\"Adam Stokes is an expert in semiconductor electron microscopy with expertise in PFIB failure analysis, device characterization, and more.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/\" \/>\n<meta property=\"og:site_name\" content=\"Accelerating Science\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/thermofisher\" \/>\n<meta property=\"og:image\" content=\"https:\/\/admin.acceleratingscience.com\/wp-content\/uploads\/2026\/02\/Adam-Stokes-Headshot.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"400\" \/>\n\t<meta property=\"og:image:height\" content=\"400\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:site\" content=\"@thermofisher\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":[\"WebPage\",\"ProfilePage\"],\"@id\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/contributor\\\/stokes-adam-biography\\\/\",\"url\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/contributor\\\/stokes-adam-biography\\\/\",\"name\":\"Adam Stokes Biography on Accelerating Science\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/contributor\\\/stokes-adam-biography\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/contributor\\\/stokes-adam-biography\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/wp-content\\\/uploads\\\/2026\\\/02\\\/Adam-Stokes-Headshot.jpg\",\"datePublished\":\"2026-02-24T19:57:37+00:00\",\"description\":\"Adam Stokes is an expert in semiconductor electron microscopy with expertise in PFIB failure analysis, device characterization, and more.\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/contributor\\\/stokes-adam-biography\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/admin.acceleratingscience.com\\\/contributor\\\/stokes-adam-biography\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/contributor\\\/stokes-adam-biography\\\/#primaryimage\",\"url\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/wp-content\\\/uploads\\\/2026\\\/02\\\/Adam-Stokes-Headshot.jpg\",\"contentUrl\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/wp-content\\\/uploads\\\/2026\\\/02\\\/Adam-Stokes-Headshot.jpg\",\"width\":400,\"height\":400,\"caption\":\"Adam Stokes\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/contributor\\\/stokes-adam-biography\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Contributors\",\"item\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/contributors\\\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"Stokes, Adam\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/#website\",\"url\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/\",\"name\":\"Accelerating Science\",\"description\":\"Where forward-thinking scientists, educators and safety professionals come to share and discover information that makes the world a cleaner, safer & healthier place to live.\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/admin.acceleratingscience.com\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"}]}<\/script>\n<!-- \/ Yoast SEO Premium plugin. -->","yoast_head_json":{"title":"Adam Stokes Biography on Accelerating Science","description":"Adam Stokes is an expert in semiconductor electron microscopy with expertise in PFIB failure analysis, device characterization, and more.","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.thermofisher.com\/blog\/contributor\/stokes-adam-biography\/","og_locale":"en_US","og_type":"article","og_title":"Stokes, Adam","og_description":"Adam Stokes is an expert in semiconductor electron microscopy with expertise in PFIB failure analysis, device characterization, and more.","og_url":"https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/","og_site_name":"Accelerating Science","article_publisher":"https:\/\/www.facebook.com\/thermofisher","og_image":[{"width":400,"height":400,"url":"https:\/\/admin.acceleratingscience.com\/wp-content\/uploads\/2026\/02\/Adam-Stokes-Headshot.jpg","type":"image\/jpeg"}],"twitter_card":"summary_large_image","twitter_site":"@thermofisher","twitter_misc":{"Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":["WebPage","ProfilePage"],"@id":"https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/","url":"https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/","name":"Adam Stokes Biography on Accelerating Science","isPartOf":{"@id":"https:\/\/admin.acceleratingscience.com\/#website"},"primaryImageOfPage":{"@id":"https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/#primaryimage"},"image":{"@id":"https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/#primaryimage"},"thumbnailUrl":"https:\/\/admin.acceleratingscience.com\/wp-content\/uploads\/2026\/02\/Adam-Stokes-Headshot.jpg","datePublished":"2026-02-24T19:57:37+00:00","description":"Adam Stokes is an expert in semiconductor electron microscopy with expertise in PFIB failure analysis, device characterization, and more.","breadcrumb":{"@id":"https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/#primaryimage","url":"https:\/\/admin.acceleratingscience.com\/wp-content\/uploads\/2026\/02\/Adam-Stokes-Headshot.jpg","contentUrl":"https:\/\/admin.acceleratingscience.com\/wp-content\/uploads\/2026\/02\/Adam-Stokes-Headshot.jpg","width":400,"height":400,"caption":"Adam Stokes"},{"@type":"BreadcrumbList","@id":"https:\/\/admin.acceleratingscience.com\/contributor\/stokes-adam-biography\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/admin.acceleratingscience.com\/"},{"@type":"ListItem","position":2,"name":"Contributors","item":"https:\/\/admin.acceleratingscience.com\/contributors\/"},{"@type":"ListItem","position":3,"name":"Stokes, Adam"}]},{"@type":"WebSite","@id":"https:\/\/admin.acceleratingscience.com\/#website","url":"https:\/\/admin.acceleratingscience.com\/","name":"Accelerating Science","description":"Where forward-thinking scientists, educators and safety professionals come to share and discover information that makes the world a cleaner, safer & healthier place to live.","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/admin.acceleratingscience.com\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"}]}},"taxonomy_info":{"expertise":[{"value":104,"label":"Failure Analysis"},{"value":203,"label":"Plasma Focused Ion Beam"},{"value":237,"label":"Semiconductor"}]},"featured_image_src_large":["https:\/\/admin.acceleratingscience.com\/wp-content\/uploads\/2026\/02\/Adam-Stokes-Headshot.jpg",400,400,false],"author_info":[],"comment_info":"","jetpack_sharing_enabled":true,"_links":{"self":[{"href":"https:\/\/www.thermofisher.com\/blog\/wp-json\/wp\/v2\/contributor\/1442","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.thermofisher.com\/blog\/wp-json\/wp\/v2\/contributor"}],"about":[{"href":"https:\/\/www.thermofisher.com\/blog\/wp-json\/wp\/v2\/types\/contributor"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.thermofisher.com\/blog\/wp-json\/wp\/v2\/media\/1443"}],"wp:attachment":[{"href":"https:\/\/www.thermofisher.com\/blog\/wp-json\/wp\/v2\/media?parent=1442"}],"wp:term":[{"taxonomy":"expertise","embeddable":true,"href":"https:\/\/www.thermofisher.com\/blog\/wp-json\/wp\/v2\/expertise?post=1442"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}