Brandon Van Leer\u2019s professional background has focused largely on characterization and development of materials and polymers. He has over 28 years\u2019 experience in various analytical techniques and\u00a0 >20 years exploring SEM and FIB. Brandon\u2019s current research interests are applications development for inert gas sample transfer, cryo-plasma FIB and multi-ion source plasma FIB for air and beam sensitive materials. Brandon received his BS in Physics (1998) and his MS in Electrical Engineering (2002) from Oregon State University. He is a member of MSA, MRS and IEEE.<\/p>\n","protected":false},"featured_media":818,"template":"","meta":{"_acf_changed":false,"_kad_blocks_custom_css":"","_kad_blocks_head_custom_js":"","_kad_blocks_body_custom_js":"","_kad_blocks_footer_custom_js":"","_monsterinsights_skip_tracking":false,"_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":""},"expertise":[345,346,343,270,344,234],"class_list":{"0":"post-808","1":"contributor","2":"type-contributor","3":"status-publish","4":"has-post-thumbnail","6":"expertise-3d-serial-sectioning","7":"expertise-clean-energy-materials","8":"expertise-focused-ion-beams","9":"expertise-materials-analysis","10":"expertise-s-tem-sample-preparation","11":"expertise-scanning-electron-microscopy","12":"entry"},"acf":{"first_name":"Brandon","last_name":"Van Leer","display_name":"Brandon Van Leer","credentials":"-Oregon State University \u2013 M.S., Electrical and Computer Engineering
-Oregon State University \u2013 B.S. Physics","job_title":"Director of Market and Business Development","company":"Thermo Fisher Scientific","short_description":"Brandon Van Leer, a Senior Applications & Business Development Manager at Thermo Fisher Scientific since 2004, specializes in materials characterization and has over 25 years of experience, including significant research in plasma FIB and multi-ion source plasma FIB applications","education":"Electrical Engineering Physics and Masters, Electrical Engineering from Oregon State University","email_address":"brandon.van.leer@thermofisher.com","linkedin_profile":"https:\/\/www.linkedin.com\/in\/brandonvanleer\/","x_profile":"","external_link":"","headshot":818,"accomplishments":"Brandon Van Leer has over 25 years of experience in various analytical techniques and over 20 years exploring SEM and FIB. He received his BS in Physics (1988) and his MS in Electrical Engineering (2002) from Oregon State University and is a member of MSA, MRS, and IEEE.","publications":[{"author_name":"S. Bai, Z. Liu, et. al. ","publication_date":"December 2024","publication":"Guidelines for Correlative Imaging and Analysis of Reactive Lithium Metal Battery Materials","article":"","pages":"DOI:10.48550\/arXiv.2412.19376","link":"https:\/\/www.researchgate.net\/publication\/387512231_Guidelines_for_Correlative_Imaging_and_Analysis_of_Reactive_Lithium_Metal_Battery_Materials"},{"author_name":"H. Tsurusawa, N. Nakanishi et. al. ","publication_date":"February 2021","publication":"Microscopy and Microanalysis ","article":"Robotic fabrication of thin samples for transmission electron microscopy with deep sub-angstrom atomic resolution","pages":"","link":"https:\/\/www.researchgate.net\/publication\/362195962_Robotic_Fabrication_of_High-quality_Lamellae_for_Aberration-corrected_Transmission_Electron_Microscopy"}],"recognitions":[{"organization":"Patent","recognition":"Systems and methods for performing sample lift-out for highly reactive materials (US12165832B2)","date":""},{"organization":"Patent","recognition":"Data Acquisition and Processing Techniques for Three-Dimensional Reconstruction (US20220208508A1)","date":""}],"certifications":null},"yoast_head":"\n