Oct 29, 2017 - Nov 02, 2017
Tampa Convention Center | Tampa, Florida

Join at AVS 64th International Symposium and Exhibition, Booth #416, to learn about our latest product offerings for XPS and surface analysis. This year we introduce the Thermo Scientific Nexsa XPS system, a fully automated multi-technique surface analysis instrument. Discover high throughput analysis without sacrificing research grade results. Nexsa gives you XPS, ISS, UPS, REELS and Raman results for true correlative analysis.

Stop by Booth #416 to sign-up for a live demonstration of the Nexsa system or any of our XPS instruments.





Live, In-Booth Demonstrations

Booth #416

Sign-up for a time slot in booth
Phase Quantification of Mixed TiO2 Powders by X-ray Photoemission Valence Band Analysis and Raman Room 17
Spectroscopy AS+BI+MI-MoM11

Mon 11:40AM

New Product Developments from Thermo Fisher Scientific

West Hall

Tue 10:40AM

XPS Depth Profiling of SrTiO3 and HfO2 with Small Argon Clusters

Room 17

Wed 8:20AM

Poster: In-situ Characterisation of Gas Cluster Ion Beam Cleaning of CVD-grown Graphene with ToF-SIMS, XPS and Raman Spectroscopy

Central Hall

Thur 3:20PM