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Sample preparation for electron microscopy
Diverse research fields demand specific sample preparation methods. Battery research samples are often air and beam sensitive, requiring careful preparation to prevent damage and degradation. With over 30 years of innovation through our Thermo Scientific DualBeam product line, we provide an extensive product range and advanced automation features to cater to various applications, including transmission electron microscopy sample preparation, subsurface analysis, and 3D characterization.
Battery research
Developing novel battery materials often requires atomic-scale analysis with a transmission electron microscope (TEM). These samples are commonly sensitive to both air and electron beams, complicating sample preparation. When precise, site-specific information is required, FIB-SEM instruments represent the sole dependable solution for accurate preparation.
Thermo Fisher Scientific provides a comprehensive suite of instruments and application support for analyzing nanometer-scale battery materials. This includes cryogenically enabled DualBeam and TEM systems, automation software, and inert gas sample transfer (IGST) workflow.
HR-TEM image of Li-metal crystal lattice. Sample prepared with Helios 5 Hydra DualBeam FIB-SEM. Captured on Talos F200X TEM with XCFEG source. Courtesy of Lin Jiang, Thermo Fisher Scientific.
Metals research
Understanding the link between microstructure and properties is crucial for designing novel metal alloys. Properties like strength, ductility, and corrosion resistance can be tailored by adjusting composition and process parameters. Microstructure elements, such as dislocations, interfaces, and grain boundaries, require micro- to nanoscale analysis. In many industries, nanoparticles are employed to enhance product or process performance. As these particles can be smaller than 10 nm and comprise multiple compounds, proper characterization necessitates a transmission electron microscope (TEM).
Thermo Scientific DualBeam FIB-SEMs offer efficient, precise, and reliable techniques for site-specific, high-quality TEM sample preparation for a wide range of metals and alloys.
Automated Particle Workflow (APW) on metals: segregation of nm scale precipitates in surgical grade steel (EDS map). Sample prepared with a Helios 5 PFIB, followed by APW on a Talos TEM.
Thin films and coatings research
Thin films and coatings have diverse applications in industries like automotive, electronics, and optics. Designing and synthesizing these materials often necessitates nanoscale structural and interface characterization via transmission electron microscopy (TEM).
Sample preparation is critical for obtaining dependable and consistent results. Conventional (mechanical) methods are problematic due to the potential for damaging the sample structure or introducing artifacts, particularly with complex materials. Thermo Scientific DualBeam FIB-SEMs provide advanced, site-specific TEM sample preparation capabilities, offering specialized workflows and application expertise tailored for thin films and coatings.
TEM sample of an LED display automatically prepared using a Helios DualBeam FIB-SEM
For Research Use Only. Not for use in diagnostic procedures.