Search
c7c8 - Key/Specs/Resources/Appl/Tech/Doc/Contact
SEM imaging and EDS elemental analysis
Even though scanning electron microscopy (SEM) has made tremendous advances, it can be considered by new users to be a complicated technique. Sample preparation, alignments, cost of ownership, and difficulties with analytical techniques prevent widespread adoption. We set out to resolve these challenges in order to make a truly accessible SEM without compromising on flexibility. Our goal was to make microscopy an easy and enjoyable experience in which you should not have to fight the microscope to obtain quality data. The result is the Thermo Scientific Axia ChemiSEM Scanning Electron Microscope, a system in which obtaining SEM-EDS data is no longer a chore. EDS is no longer just an afterthought—chemical data and imaging have now become one.
SEM EDS analysis
The Axia ChemiSEM is unlike traditional SEMs in that it always collects EDS data in the background. It uses unique algorithms to process the SEM and EDS signals simultaneously, allowing it to display the morphology and quantitative elemental make up of a sample together, in real time. It constantly processes EDS data in the background, giving you live updates on elemental data, as it is acquired. Elements found in your sample can be toggled on and off, allowing you to isolate areas of interest.
The Axia ChemiSEM features a superior user experience enhanced by automation, such as SmartAlign technology for alignment-free operation, newly developed automatic functions, and live quantitative EDS mapping. This always-on processing make analysis twice as fast, compared to traditional methods. The Axia ChemiSEM Scanning Electron Microscope puts SEM/EDS analysis within reach of a wider scientific audience, speeds up your workflow, and saves time on training.
Live quantitative elemental mapping
Update your Analytical workflow with fully integrated, cutting-edge Thermo Scientific ChemiSEM technology that provides characterization in half the time.
Easy to get started
Integrated User Guidance, live real-time compositional imaging, and alignment-free operation combine on this instrument to allow you to stay focused on data collection.
Flexible sample loading
The flexible stage accommodates samples up to 10 kg with x-y movement, and the door opens fully for easy loading of large, awkward samples - while retaining a very fast pump down time.
Excellent imaging performance
Easily handle a wide range of applications, including insulating samples with Low Vac operation and advanced beam scanning to ensure high-fidelity imaging
Diverse application software
Handle advanced applications with advanced system automation option, such as Thermo Scientific Maps™ Software, and customize workflow development with Thermo Scientific AutoScript™ Software.
Easy maintenance
Source exchange is easy and can be completed by any user, while the straightforward design translates to high uptime and rapid service when attention is needed.
Style Sheet for Products Table Specifications
| Standard |
|
| Electron beam resolution |
|
| Chamber |
|
| Stage |
|
| Common options |
|
Style Sheet for Komodo Tabs
On-demand Webinar: Meet our newest SEM
Attend this webinar to:
- Discover zero-click elemental analysis that enhances accessibility and productivity with live quantitative elemental imaging.
- Experience the future-proof flexibility of a large chamber, support of samples up to 10 kg, and enough ports to accommodate many accessories.
- Find out how you can save time with fast pumping, automatic alignments, and an easy interface.
Color coatings (zinc silicate) incorporating Ba, Ti, S fillers and iron traces imaged with the retractable BSE detector. Axia ChemiSEM provides instant access to the chemical variations of the different fillers. (Acc voltage 20 keV, beam current 3.6 nA)
The instant quantitative elemental mapping provided by Axia ChemiSEM allows to highlight the presence of Al, Mg and Ti contaminants that would have been otherwise unnoticed. (Acc voltage 10 keV, beam current 0.76 nA)
Copper and Nickel coated brass. As Cu and Ni have similar atomic number the compositional information provided by the backscattered electrons detector is not enough to clarify the layers’ distribution. That information, with Axia ChemiSEM is one click away. (Acc voltage 20 keV, beam current 0.94 nA)
Tungsten carbide (WC-Co) drill bit with a titanium aluminum nitride (TiAlN) coating. The distribution of the different elements is easily provided by the quantitative elemental imaging of Axia ChemiSEM. (Acc voltage 15 keV, beam current 0.85 nA)
Chrome plated aluminum alloy. The sample has a copper and nickel coating whose difference is not evident as Cu and Ni have similar atomic number, thus the compositional information provided by the backscattered electrons detector is not enough to clarify the layers’ distribution. That information, with Axia ChemiSEM is one click away. (Acc voltage 20 keV, beam current 0.48 nA)
Facemask: Weft thread of a facemask showing the presence of different particles on it. Their nature and the distribution of the different elements (Al, Ca, Na, Cl, K) is easily recognizable thanks to the instant chemical information provided by Axia ChemiSEM. (Acc voltage 10 keV, beam current 0.39 nA)
Section of a geological sample acquired combining the live quantitative elemental information and the navigation montage feature. The navigation montage allows to collect multiple images over a wide area automatically (in this case 13x13 frames have been acquired). Thanks to the instantaneous elemental information provided by Axia ChemiSEM, the montage shows the chemical variability within the grains over a large thin section and permits the user to identify areas of interest for further analysis.
Polished cement surface highlighting several chemical variations that were not visible with the contribution of the retractable BSE detector only. (Acc voltage 20 keV, beam current 0.48 nA)
Zirconium oxide (ZrO2) precipitates in different inclusions in steel. Sample courtesy of Laboratory team of Primetals Austria.
Inhomogeneities in the surface of an aluminum alloy manufactured object. (Acc voltage 15 keV, beam current 0.44 nA)
Calcium carbonates (CaCO3). The image shows three different polymorphs (aragonite, calcite, vaterite) with different morphologies and size distribution. (Acc voltage 15 keV, beam current 0.44 nA)
Polycristalline alumina (PCA).
Image (left): Acc voltage 2 keV, beam current 45 pA. Image (right); Acc voltage 15 keV, beam current 7.9 pA
Silver on gold nanosheets. High resolution results are possible with Axia ChemiSEM. (Acc voltage 15 keV, beam current 7.9 pA)
A ceramic catalytic converter honeycomb mounted inside the Axia ChemiSEM's chamber, ready to be imaged. No sample preparation or special mounting is required.
Download our ebook, SEM and EDS Analysis in Industry, to learn more about:
- How the joint application of SEM and EDS analysis supports in-depth material characterization for industrial applications
- How our unique Thermo Scientific ChemiSEM Technology integrates these two techniques into a single, fast, easy-to-use package, which is accessible and valuable to novices and experts alike
On-demand Webinar: Meet our newest SEM
Attend this webinar to:
- Discover zero-click elemental analysis that enhances accessibility and productivity with live quantitative elemental imaging.
- Experience the future-proof flexibility of a large chamber, support of samples up to 10 kg, and enough ports to accommodate many accessories.
- Find out how you can save time with fast pumping, automatic alignments, and an easy interface.
Color coatings (zinc silicate) incorporating Ba, Ti, S fillers and iron traces imaged with the retractable BSE detector. Axia ChemiSEM provides instant access to the chemical variations of the different fillers. (Acc voltage 20 keV, beam current 3.6 nA)
The instant quantitative elemental mapping provided by Axia ChemiSEM allows to highlight the presence of Al, Mg and Ti contaminants that would have been otherwise unnoticed. (Acc voltage 10 keV, beam current 0.76 nA)
Copper and Nickel coated brass. As Cu and Ni have similar atomic number the compositional information provided by the backscattered electrons detector is not enough to clarify the layers’ distribution. That information, with Axia ChemiSEM is one click away. (Acc voltage 20 keV, beam current 0.94 nA)
Tungsten carbide (WC-Co) drill bit with a titanium aluminum nitride (TiAlN) coating. The distribution of the different elements is easily provided by the quantitative elemental imaging of Axia ChemiSEM. (Acc voltage 15 keV, beam current 0.85 nA)
Chrome plated aluminum alloy. The sample has a copper and nickel coating whose difference is not evident as Cu and Ni have similar atomic number, thus the compositional information provided by the backscattered electrons detector is not enough to clarify the layers’ distribution. That information, with Axia ChemiSEM is one click away. (Acc voltage 20 keV, beam current 0.48 nA)
Facemask: Weft thread of a facemask showing the presence of different particles on it. Their nature and the distribution of the different elements (Al, Ca, Na, Cl, K) is easily recognizable thanks to the instant chemical information provided by Axia ChemiSEM. (Acc voltage 10 keV, beam current 0.39 nA)
Section of a geological sample acquired combining the live quantitative elemental information and the navigation montage feature. The navigation montage allows to collect multiple images over a wide area automatically (in this case 13x13 frames have been acquired). Thanks to the instantaneous elemental information provided by Axia ChemiSEM, the montage shows the chemical variability within the grains over a large thin section and permits the user to identify areas of interest for further analysis.
Polished cement surface highlighting several chemical variations that were not visible with the contribution of the retractable BSE detector only. (Acc voltage 20 keV, beam current 0.48 nA)
Zirconium oxide (ZrO2) precipitates in different inclusions in steel. Sample courtesy of Laboratory team of Primetals Austria.
Inhomogeneities in the surface of an aluminum alloy manufactured object. (Acc voltage 15 keV, beam current 0.44 nA)
Calcium carbonates (CaCO3). The image shows three different polymorphs (aragonite, calcite, vaterite) with different morphologies and size distribution. (Acc voltage 15 keV, beam current 0.44 nA)
Polycristalline alumina (PCA).
Image (left): Acc voltage 2 keV, beam current 45 pA. Image (right); Acc voltage 15 keV, beam current 7.9 pA
Silver on gold nanosheets. High resolution results are possible with Axia ChemiSEM. (Acc voltage 15 keV, beam current 7.9 pA)
A ceramic catalytic converter honeycomb mounted inside the Axia ChemiSEM's chamber, ready to be imaged. No sample preparation or special mounting is required.
Download our ebook, SEM and EDS Analysis in Industry, to learn more about:
- How the joint application of SEM and EDS analysis supports in-depth material characterization for industrial applications
- How our unique Thermo Scientific ChemiSEM Technology integrates these two techniques into a single, fast, easy-to-use package, which is accessible and valuable to novices and experts alike
Process control using electron microscopy
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
ColorSEM
Grâce à l’utilisation de l’EDS en direct (spectroscopie à rayons X à dispersion d’énergie) et de la quantification en direct, la technologie ColorSEM transforme l’imagerie par SEM en technique de couleur. Tout utilisateur peut désormais acquérir des données élémentaires en continu pour obtenir des informations plus complètes que jamais.
Imagerie d’échantillons chauds
L’étude des matériaux dans des conditions réelles implique souvent de travailler à des températures élevées. Le comportement des matériaux à mesure qu’ils recristallisent, fondent, se déforment ou réagissent en présence de chaleur peut être étudié in situ à l’aide de la microscopie électronique à balayage ou d’outils DualBeam.
Analyse des particules
L’analyse des particules joue un rôle essentiel dans la recherche sur les nanomatériaux et le contrôle de la qualité. La résolution à l’échelle du nanomètre et l’imagerie supérieure de la microscopie électronique peuvent être associées à des logiciels spécialisés pour la caractérisation rapide des poudres et des particules.
Cathodoluminescence
La cathodoluminescence (CL) décrit l’émission de lumière à partir d’un matériau lorsqu’il est excité par un faisceau d’électrons. Ce signal, capturé par un détecteur CL spécialisé, contient des informations sur la composition de l’échantillon, les défauts cristallins ou les propriétés photoniques.
ColorSEM
Grâce à l’utilisation de l’EDS en direct (spectroscopie à rayons X à dispersion d’énergie) et de la quantification en direct, la technologie ColorSEM transforme l’imagerie par SEM en technique de couleur. Tout utilisateur peut désormais acquérir des données élémentaires en continu pour obtenir des informations plus complètes que jamais.
Imagerie d’échantillons chauds
L’étude des matériaux dans des conditions réelles implique souvent de travailler à des températures élevées. Le comportement des matériaux à mesure qu’ils recristallisent, fondent, se déforment ou réagissent en présence de chaleur peut être étudié in situ à l’aide de la microscopie électronique à balayage ou d’outils DualBeam.
Analyse des particules
L’analyse des particules joue un rôle essentiel dans la recherche sur les nanomatériaux et le contrôle de la qualité. La résolution à l’échelle du nanomètre et l’imagerie supérieure de la microscopie électronique peuvent être associées à des logiciels spécialisés pour la caractérisation rapide des poudres et des particules.
Cathodoluminescence
La cathodoluminescence (CL) décrit l’émission de lumière à partir d’un matériau lorsqu’il est excité par un faisceau d’électrons. Ce signal, capturé par un détecteur CL spécialisé, contient des informations sur la composition de l’échantillon, les défauts cristallins ou les propriétés photoniques.
Style Sheet to change H2 style to p with em-h2-header class
Style Sheet for Support and Service footer
Style Sheet for Fonts
Style Sheet for Cards