Nexsa G2 Surface Analysis System

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Nexsa G2 Surface Analysis System features

Nexsa G2 Surface Analysis System specifications

XPS analysis resources

Analysis of Electrode Materials for Lithium-Ion Batteries

Advantages of Coincident XPS-Raman in the Analysis of Mineral Oxides Species

Brake Pad Analysis for Wear Characteristics, Reverse Engineering, or Failure Analysis

Composition, Coverage, and Band Gap Analysis of ALD-Grown Ultra-Thin Films

Confirming the Layer Structure of an Organic FET Device

Rapid XPS Image Acquisition Using SnapMap

Spectroscopic Analysis of Solid Oxide Fuel Cell Material with XPS

Understanding the Chemical and Electronic Properties of OLED Materials

XPS Characterization of a Membrane Electrode Assembly from a Proton Exchange Fuel Cell

Depth Profiling of an Organic FET with XPS and Argon Cluster Ions

Multi-technique composition, coverage and band gap analysis of ALD-grown ultra-thin films

XPS characterization of a membrane electrode assembly from a proton exchange fuel cell

Datasheet: Nexsa G2 Surface Analysis System

Flyer: XPS Quick guide

Brochure: Instrumentation for Surface Analysis

Whitepaper: The Surface Analysis Toolbox