Search
XPS instrument overview
For over 50 years, Thermo Fisher Scientific has provided surface analysis instruments to academic and industrial customers. Our instruments deliver the performance required for advanced materials science research, product development, and failure analysis. Our diverse portfolio is designed to cater to various applications, accommodating routine, high-throughput measurements, as well as complex experimental workflows.
XPS Instruments specifications
| K-Alpha System | Nexsa G2 System | Hypulse System | ESCALAB QXi Microprobe |
||
XPS instrument capabilities |
Large-area XPS |  |
|
|
|
| Small-area XPS | |
|
|
|
|
| XPS imaging | |
|
|
|
|
| SnapMap | |
|
|
||
| Charge compensation system for insulator analysis | |
|
|
|
|
| Ion source for depth profiling | |
|
|
|
|
| fs-laser for depth profiling | |
||||
| Angle-dependent XPS | Optional | Optional | Optional | |
|
| Automated sample transfer | |
|
|
Optional | |
| XPS instrument analytical options | Raman spectroscopy | Optional | Optional | ||
| MAGCIS Ion Source | Optional | |
Optional | ||
| Reflected electron energy loss spectroscopy (REELS) | Optional | |
|
||
| Low energy ion scattering spectroscopy (ISS/LEIS) | Optional | |
|
||
| UV photoelectron spectroscopy (UPS) | Optional | Optional | Optional | ||
| Auger electron spectroscopy | Optional | ||||
| Sample preparation options | Optional | Optional | Optional | ||
| Inert sample transfer | Optional | Optional | Optional | Optional | |
| Higher energy X-ray sources (HAXPES) | Optional |
For Research Use Only. Not for use in diagnostic procedures.