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Cryogenic plasma focused ion beam (PFIB) preparation allows researchers to probe the frozen liquid-solid interfaces of biological and physical materials. In batteries, these interfaces are the key location of functionality and often breakdown. To improve battery design, you must first understand structurally and chemically complex interfaces such as the solid electrolyte interface.
In this webinar, you will discover:
- How to analyze atomic details of these materials and interfaces using cryogenic PFIB, vacuum and cryogenic sample transfer, and correlative analysis techniques like atom probe tomography and transmission electron microscopy
The unique steps required when preparing samples in a PFIB at cryogenic and room temperatures
How to use PFIB vacuum transfer to protect air-sensitive materials like solid magnetic and superconductor samples
About the speakers
Dr. Shelly Conroy, Lecturer in Functional Thin Films and Microscopy, Department of Materials, Imperial College London
Dr. Conroy is a Royal Society University Research Fellow and lecturer in functional thin films and microscopy specializing in in-situ TEM, 4D-STEM, and EELS. The Conroy group at Imperial designs quantum and energy materials at the atomic scale using electron and atom probe microscopy techniques. Her group is part of the new cryo-microscopy facility for engineering and physical sciences at Imperial and the Royce Imperial “Atoms to Devices” thin film growth facility. In 2019, Dr. Conroy was awarded an SFI Industry Research PI grant with Analog Devices. She has previously held positions at University of Limerick and the Pacific Northwest National Laboratory. She holds a PhD in AlN thin film growth for optoelectronic device applications, FIB sample preparation for TEM, and in-situ TEM from Tyndall National Institute and University College Cork Ireland.
Dr. James Douglas, Research Facility Manager, Department of Materials, Imperial College London
Dr. Douglas is a research facility manager in the Department of Materials at Imperial, specializing in atom probe tomography. His responsibilities include helping run the Imperial Centre for Cryo Microscopy of Materials (I(CM)2), training students and staff on instrumentation, atom probe data analysis, and associated sample preparation and complementary microscopy. His areas of expertise also include focused ion beam sample preparation, scanning electron microscopy, energy dispersive X-ray spectroscopy, electron backscatter diffraction, and transmission Kikuchi diffraction. Dr. Douglas is also involved in developing process flows for complementary transmission electron microscopy and APT analysis of materials using cryo and vacuum transfer between instruments. Prior to his current role, he was the atom probe scientist for the National Nuclear User Facility (NNUF) Nuclear Materials Atom Probe (NuMAP) at the University of Oxford. He completed his materials DPhil at the University of Oxford in 2017.