Specifications
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
Certifications/ComplianceISO 9001:2008
ConnectionsUSB or RS-232
DescriptionEvolution 201 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
HoldsCuvettes up to 100 mm
IncludesEU/US/UK power cords
Lamp Life7 years typical
Noise0A: <0.00015A;
1A:<0.00025A;
2A: <0.00080A;
260 nm, 1.0 nm SBW, RMS
Optical DesignDouble Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
Pharmacopoeia Compliance TestingPhotometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198 nm: KCI; ≤0.05%AT at 220 nm: Nal, Kl
Wavelength Accuracy: ±.5 nm 541.9, 546.1nm Hg emission lines, ±0.8 nm full range
Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorMicrosoft Windows 7, Windows 8
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wattage150 W max.
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (English)32 lb.
Weight (Metric)14.4 kg
Detector TypeDual Silicon Photodiodes
DisplayNo Display
Product LineEvolution 201
Spectral Bandwidth1 nm
TypeComputer Control Spec
Wavelength Range190 to 1100 nm
Unit SizeEach