Specifications
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
Certifications/ComplianceISO 9001:2008
ConnectionsUSB or RS-232
DescriptionEvolution 201 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
Detector TypeDual Silicon Photodiodes
DisplayNo Display
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 201
Spectral Bandwidth1 nm
TypeComputer Control UV-Vis Spectrophotometer
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
HoldsCuvettes up to 100 mm
IncludesEU/US/UK power cords
Lamp Life7 years typical
Noise0A: <0.00015A;
1A:<0.00025A;
2A: <0.00080A;
260 nm, 1.0 nm SBW, RMS
Optical DesignDouble Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
Pharmacopoeia Compliance TestingPhotometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198 nm: KCI; ≤0.05%AT at 220 nm: Nal, Kl
Wavelength Accuracy: ±.5 nm 541.9, 546.1nm Hg emission lines, ±0.8 nm full range
Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorMicrosoft Windows 7, Windows 8
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wattage150 W max.
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (English)32 lb.
Weight (Metric)14.4 kg
Unit SizeEach