CleanMill Broad Ion Beam System

High-quality observation and characterization of materials often require an artifact-free surface, which can be difficult to achieve with traditional polishing techniques like grinding or mechanical polishing.

The Thermo Scientific™ CleanMill Broad Ion Beam System is a complete ion beam polishing solution for SEM applications in materials science, enabling optimal imaging and analysis of materials where a pristine surface is required, including beam- and air-sensitive materials.

The CleanMill System is fully compatible with the Thermo Scientific™ CleanConnect Sample Transfer System, making it easy to quickly transfer samples between instruments while minimizing sample handling.

Find more information: CleanMill Broad Ion Beam System

CleanMill Broad Ion Beam System features

High-energy ion source

The ultra-high-energy ion gun features a maximum accelerating voltage of 16 kV to rapidly mill and polish sample surfaces.

Ultra-fine surface polishing

The CleanMill System can be configured with an optional low-energy io n gun for final polishing of sample surfaces.

Wide acceleration voltage

The system delivers ion energy ranging from 2 kV to 16 kV and features dedicated optics for ultra-low-voltage polishing from 100 V to 2 kV.

CleanConnect System compatibility

Safely transfer samples from the CleanMill System to the microscope chamber using the Thermo Scientific IGST (inert gas sample transfer) Workflow to observe materials in their native states.

Real-time monitoring

The integrated touchscreen and high-resolution camera help you keep track of the broad ion beam milling process.

Cryogenic milling

The optional cryo-stage delivers LN₂ cooling with automatic refilling for working with extremely beam-sensitive materials.