Key Benefits:

• Highest-quality, site-specific, sample preparation for TEM and APT using the new high throughput Tomahawk HT Ion Column
• Fastest and easiest, fully automated, unattended, multisite in situ and ex situ TEM sample preparation and cross sectioning using optional AutoTEM 5 Software
• Shortest time to nanoscale information for users with any experience level using best-in-class Elstar Electron Column featuring SmartAlign and FLASH technologies
• The most complete sample information with sharp, refined and charge-free contrast obtained from up to six integrated in-column and below-the-lens detectors
• The highest-quality, multi-modal subsurface and 3D information with the most precise targeting of the region of interest using optional Auto Slice & View 4 (AS&V4) Software
• Fast, accurate and precise milling and deposition of complex structures with critical dimensions of less than 10 nm
• Easiest sample handling and navigation with high flexibility 110 mm stage, multi-purpose sample holder and Nav-Cam+
• Artifact-free imaging based on integrated sample cleanliness management and dedicated imaging modes such as DCFI and SmartScan Modes