Thermo Scientific™

K-Alpha X-ray Photoelectron Spectrometer (XPS) System

 Related applications:
Spectroscopy Elemental Isotope Analysis
Achieve research-grade results with the minimum effort. The Thermo Scientific™ K-Alpha™ X-ray Photoelectron Spectrometer (XPS) System is a fully integrated, monochromated small-spot XPS system with depth profiling capabilities. State-of-the-art performance, reduced cost of ownership, increased ease of use and compact size make the K-Alpha X-ray XPS System ideal for a multi-user environment.

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Designed for Productivity, from Research to Routine

The K-Alpha spectrometer delivers much improved spectroscopic performance. This leap forward results in faster analysis times, improved element detection, and the possibility to acquire data at higher resolution yielding better chemical state identification.

Analytical options include the revolutionary dual mode ion source, a vacuum transfer module for moving air-sensitive samples from a glove box to the system, and the tilt module for ARXPS data collection. Equipped with the Thermo Scientific™ Avantage Data System, the complete surface analysis software system, the K-Alpha+ has a range of software features designed to optimize data interpretation, data reporting and usability. The K-Alpha XPS system meets the requirements of both experienced XPS analysts and newcomers to the technique, bringing together high performance, monochromated XPS and sputter depth profiling, with intelligent automation and intuitive control.

Powerful Performance

  • Selectable area spectroscopy
  • Sputter depth profiling
  • Micro-focused monochromator
  • Snapshot acquisition
  • High-resolution chemical state spectroscopy
  • Insulator analysis
  • Quantitative chemical imaging

Unparalleled Ease of Use

  • Acquisition — spectra, images, profiles, line scans
  • Interpretation — elemental and chemical state identification
  • Processing — Quantification, peak fitting, real-time profile display, spectrum-image manipulation, PCA, phase analysis, TFA, NLLSF, PSF removal, optical/XPS image overlays
  • Reporting — automatic report generation with simple export to other software packages
  • Control — all hardware controlled from the Avantage software interface
  • Avantage Indexer — data archive management
  • Audit trail logging
  • System performance logging
  • Calibration on demand
  • Full remote operation

Key Features

  • Analyzer — 180° double focusing hemispherical analyzer with 128-channel detector
  • X-ray source — Al Ka micro-focused monochromator with variable spot size (30-400µm in 5µm steps)
  • Ion Gun — Energy range 100-4000eV
  • Charge Compensation — Dual beam source
  • Sample Handling — 4-axis sample stage, 60 x 60mm sample area, 20mm maximum sample thickness
  • Vacuum System — 2x 260L/s turbo molecular pumps for entry and analysis chambers
  • Options —Thermo Scientific™ MAGCIS™ Dual Beam Ion Source, vacuum transfer module, tilt module for ARXPS, sample bias module.
XPS Wiley Booklet

Free Booklet – X-ray Photoelectron Spectroscopy

Order the 30-page XPS booklet from the Wiley Essential Knowledge Briefing series. Learn about:

  • History and Background
  • In Practice
  • Problems and Solutions
  • Case Studies

The ideal booklet for understanding and communicating how XPS works and what it does.

Download your copy ›


Manuals & protocols