WDS MagnaRay Spectrometer

Thermo Scientific™  Related applications: Spectroscopy Elemental Isotope Analysis

Achieve unparalleled speed and confidence in elemental analysis in your electron microscope, automatic intelligent alignment and parameter setting from the Thermo Scientific™ WDS MagnaRay Spectrometer—making high resolution microanalysis as easily to use as an EDS system.

The built-in expert system automatically handles alignment, analysis settings and acquisitions, combining data with EDS results to produce a truly integrated EDS/WDS system.
 

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Description

Closely integrated with the Thermo Scientific™ Noran™ System 7 X-ray Microanalysis System, the WDS MagnaRay Spectrometer automatically determines the elements to analyze and performs all of the WDS operations, while the EDS detector is still collecting data. The details of the spectrometer setup and operation are handled automatically by the embedded expert system. Whether the need is for peak overlap, trace element confirmation or accurate quantitative analysis, WDS MagnaRay Spectrometer simply and quickly performs the analysis.

The WDS MagnaRay Spectrometer Features:

WDS Precision and Confidence with EDS Ease

  • Unparalleled microanalysis results
  • High resolution
  • Sensitive for trace elements
  • Continuous spectrometer coverage for full spectral range
  • Guaranteed sensitivity specification

Speed and Precision

  • Direct-drive mechanisms on both the diffracting crystals and counter allow the WDS MagnaRay Spectrometer to change between elements as quickly as 0.25 seconds — enabling rapid analysis of multiple elements in the amount of time older WDS spectrometers are moving to the first element
  • Encoders coupled to the direct-drive system ensure angular precision of better than 0.001 degree — ensuring WDS peaks always have the correct location

SEM and Low Voltage Applications
Ideal for applications where high sensitivity, light-element detection, overlapping peaks, high peak-to-background or high spatial resolution are critical.

  • X-ray optics extend into the SEM chamber, similar to a solid state EDS detector
  • High level of application performance under low-beam current and low-voltage operating conditions

Sensitivity

  • X-ray path design incorporates a focusing optic to transform the divergent X-ray emission from sample to focused parallel beam that undergoes Bragg diffraction using diffracting crystal
  • Count rates provided at both low and high energies using a proprietary hybrid X-ray focusing optic that incorporates both a polycapillary and grazing incidence optic
  • Hybrid optic joined by a single, low-energy capable, sealed Xenon proportional counter—simplifying design and operation and improving throughput for all elements compared to older gas flow proportional counter designs

Nanoscale Analysis
Ideal for samples where a small interaction volume is critical, such as nano-particles or thin films

  • Performs trace elemental analysis using peak-to-background ratios and extreme X-ray collection rates
  • Operates based on the sample and SEM—not the spectrometer
  • Operates in extreme conditions required for analysis of modern nanoscale materials—making SEM-based nanoanalysis a reality
  • Solves sample charging and sample damage problems commonly encountered with high-energy, high-current traditional WDS
  • Incorporates the best features of WDS without the detrimental requirements of high acceleration voltage or high beam current

Qualitative Analysis

  • Helps in qualitative analysis of samples by assisting EDS when significant overlaps occur
  • Automatically determines the presence or absence of elements such as Mo, S, Pb or Si, Ta, W, during the EDS acquisition, where overlaps are severe in the EDS spectrum

Quantitative Analysis

  • Eliminates concerns regarding sample position, beam current and spectrometer setup using embedded expert system
  • Aligns spectrometer automatically
  • Chooses the most appropriate element and aligns the sample and spectrometer for optimum operation
  • Provides accurate quantitative results with automated beam current measurements

X-ray Maps and Linescans

  • Produces high-contrast X-ray maps and linescans for low concentration materials
  • Acquires WDS maps and linescans easily

Join us at booth 507 at MMC 2017
3-6 July 2017 | Manchester, UK

Don't miss on-booth presentations, one-on-one demonstrations, live sample analysis, and workshops! Seats are limited.

Learn more about the events and sign up today ›

3-6 July 2017 | Manchester, UK
3-6 July 2017 | Manchester, UK
3-6 July 2017 | Manchester, UK
3-6 July 2017 | Manchester, UK
3-6 July 2017 | Manchester, UK
3-6 July 2017 | Manchester, UK


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Manuals & protocols