Achieve unparalleled speed and confidence in elemental analysis in your electron microscope, automatic intelligent alignment and parameter setting from the Thermo Scientific™ WDS MagnaRay Spectrometer—making high resolution microanalysis as easily to use as an EDS system.
The built-in expert system automatically handles alignment, analysis settings and acquisitions, combining data with EDS results to produce a truly integrated EDS/WDS system.
|Product Type||MagnaRay WDS Spectrometer|
|Description||Thermo Scientific WDS MagnaRay Spectrometer is designed to be used as easily as an EDS system.|
|Integrated Operation||EDS, WDS, and EBSD operation and analysis in a fully unified software platform|
|Mapping||WDS mapping concurrent with EDS quantitative mapping with a single click of the mouse.|
|Catalog Number||Specifications||Unit Size||Description||Integrated Operation||Mapping||Price (USD)|
|IQLAADGABJFAKQMAVG||Each||Thermo Scientific WDS MagnaRay Spectrometer is designed to be used as easily as an EDS system.||EDS, WDS, and EBSD operation and analysis in a fully unified software platform||WDS mapping concurrent with EDS quantitative mapping with a single click of the mouse.||Request A Quote|
Closely integrated with the Thermo Scientific™ Pathfinder™ X-ray Microanalysis Software, the WDS MagnaRay Spectrometer automatically determines the elements to analyze and performs all of the WDS operations, while the EDS detector is still collecting data. The details of the spectrometer setup and operation are handled automatically by the embedded expert system. Whether the need is for peak overlap, trace element confirmation or accurate quantitative analysis, WDS MagnaRay Spectrometer simply and quickly performs the analysis.
The WDS MagnaRay Spectrometer Features:
WDS Precision and Confidence with EDS Ease
Speed and Precision
SEM and Low Voltage Applications
Ideal for applications where high sensitivity, light-element detection, overlapping peaks, high peak-to-background or high spatial resolution are critical.
Ideal for samples where a small interaction volume is critical, such as nano-particles or thin films
X-ray Maps and Linescans