Thermo Scientific™

      Quasor II™ EBSD System

      Quasor II™ EBSD System
       Related applications:
      Spectroscopy Elemental Isotope Analysis

      Perform simultaneous acquisitions of EBSD data and EDS/WDS spectral images with ease using the Thermo Scientific™ Quasor II™ Electron Backscatter Diffraction. The Quasor II EBSD characterizes crystalline structures which affect physical properties in a wide range of materials examined with scanning electron microscopes (SEMs) and X-ray microanalysis.

      A fully integrated extension of the Thermo Scientific™ Pathfinder™ X-ray Microanalysis Software, the Quasor II system includes a full suite of acquisition and analysis capabilities.
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      Description

      The Quasor II EBSD system features:

      Making EBSD a reality

      • Collection rates up to 600 frames per second with > 99% pixels indexed
      • Three times better signal-to-noise than other CMOS cameras
      • Integrated with Pathfinder X-ray microanalysis for simultaneous EDS/WDS and EBSD data collection
      • One measurement provides both structural and chemical information about the sample
      Diffraction pattern processing and Band detect
      • Background removal by subtraction or division
      • Image cropping
      • Flat Fielding with FFT or parabolic
      • Choice of number of bands detected up to 30
      • Image normalization by line length or Hough background
        • Hough filtering with sharp, balanced or smoothed image
        • Hough clipping diameter adjustment to screen pattern quality
        • Hough transform display with editable line selection
        • Choice of number of lines to index up to 30
        • Allow elimination of bands from index scheme up to 25%
        • Automatic ranked index by band intensity
        • Crystal selection from pre-established library with over 10,000 crystals
        • Re-processing of saved diffraction patterns
        • Pattern center calibration search
        • Ability to save diffraction patterns for later reanalysis

      Designed for metallurgy

      • Develop SEM-based methods for quality control and failure analysis
      • Perform phase identification and transformation analysis following heating and cooling
      • Identify phases and size grains
      • Monitor heat affected zones after welding
      • Run predictive fracture analysis in metals
      • Validate additive manufacturing processes




      Documents

      Manuals & protocols