Thermo Scientific™

Quasor II™ EBSD System

Catalog number: IQLAADGABKFALMMAXY
Related applications: Spectroscopy Elemental Isotope Analysis
Technical SupportCustomer Service
Quasor II™ EBSD System
Quasor II™ EBSD System
Quasor II™ EBSD System
Quasor II™ EBSD System
Quasor II™ EBSD System
Thermo Scientific™

Quasor II™ EBSD System

Catalog number: IQLAADGABKFALMMAXY
Related applications: Spectroscopy Elemental Isotope Analysis
Technical SupportCustomer Service

Perform simultaneous acquisitions of EBSD data and EDS/WDS spectral images with ease using the Thermo Scientific™ Quasor II™ Electron Backscatter Diffraction. The Quasor II EBSD characterizes crystalline structures which affect physical properties in a wide range of materials examined with scanning electron microscopes (SEMs) and X-ray microanalysis.

A fully integrated extension of the Thermo Scientific™ Pathfinder™ X-ray Microanalysis Software, the Quasor II system includes a full suite of acquisition and analysis capabilities.

 
Catalog Number
IQLAADGABKFALMMAXY
Unit Size
Each
Description
Quasor II EBSD System
Price (USD)
Request A Quote
Full specifications
Operating System
  • Windows 10, Windows 8.1, Windows 7 compatible, 64-bit compatible
  • Editable crystal database (CIF format)
  • Single click reporting to Microsoft Word
  • Export and import entire map of detected Kikuchi bands to
  • *.ang or *.csv files (2)
Software Data Acquisition
  • Electron Image acquisition up to 4096 pixels at 1 microsecond dwell time per pixel
  • Tilt corrected imaging at 70 degree tilt
  • Simultaneous EBSD, EDS and WDS
  • EDS & EBSD map collection up to 1024 pixels with minimum dwell time of 100 microseconds
Camera
  • Camera dwell time from 0.1 to 5000 milliseconds
  • Collection speed up to 600 fps
  • Diffraction pattern image resolution at 320 x 240 pixels
  • Camera binning up to 2x2
  • Software controlled motorized insertion / retraction with < 0.1 mm variance
  • Dynamic gain up to 24x
Data Processing and Displays
  • Index and Pattern quality map
  • HKL orientation map
  • UVW orientation map
  • Euler orientation map
  • Crystal structure Phase maps
  • Grain boundary axis and angle maps
  • Grain size analysis
  • Grain shape analysis
  • Grain boundary CSL and special boundary maps
  • Pole figures
  • Inverse pole figures
DescriptionQuasor II EBSD System
Unit SizeEach
Showing 1 of 1
Catalog NumberSpecificationsUnit SizeDescriptionPrice (USD)
IQLAADGABKFALMMAXYFull specifications
EachQuasor II EBSD SystemRequest A Quote
Operating System
  • Windows 10, Windows 8.1, Windows 7 compatible, 64-bit compatible
  • Editable crystal database (CIF format)
  • Single click reporting to Microsoft Word
  • Export and import entire map of detected Kikuchi bands to
  • *.ang or *.csv files (2)
Software Data Acquisition
  • Electron Image acquisition up to 4096 pixels at 1 microsecond dwell time per pixel
  • Tilt corrected imaging at 70 degree tilt
  • Simultaneous EBSD, EDS and WDS
  • EDS & EBSD map collection up to 1024 pixels with minimum dwell time of 100 microseconds
Camera
  • Camera dwell time from 0.1 to 5000 milliseconds
  • Collection speed up to 600 fps
  • Diffraction pattern image resolution at 320 x 240 pixels
  • Camera binning up to 2x2
  • Software controlled motorized insertion / retraction with < 0.1 mm variance
  • Dynamic gain up to 24x
Data Processing and Displays
  • Index and Pattern quality map
  • HKL orientation map
  • UVW orientation map
  • Euler orientation map
  • Crystal structure Phase maps
  • Grain boundary axis and angle maps
  • Grain size analysis
  • Grain shape analysis
  • Grain boundary CSL and special boundary maps
  • Pole figures
  • Inverse pole figures
DescriptionQuasor II EBSD System
Unit SizeEach
Showing 1 of 1

The Quasor II EBSD system features:

Making EBSD a reality

  • Collection rates up to 600 frames per second with > 99% pixels indexed
  • Three times better signal-to-noise than other CMOS cameras
  • Integrated with Pathfinder X-ray microanalysis for simultaneous EDS/WDS and EBSD data collection
  • One measurement provides both structural and chemical information about the sample
Diffraction pattern processing and Band detect
  • Background removal by subtraction or division
  • Image cropping
  • Flat Fielding with FFT or parabolic
  • Choice of number of bands detected up to 30
  • Image normalization by line length or Hough background
    • Hough filtering with sharp, balanced or smoothed image
    • Hough clipping diameter adjustment to screen pattern quality
    • Hough transform display with editable line selection
    • Choice of number of lines to index up to 30
    • Allow elimination of bands from index scheme up to 25%
    • Automatic ranked index by band intensity
    • Crystal selection from pre-established library with over 10,000 crystals
    • Re-processing of saved diffraction patterns
    • Pattern center calibration search
    • Ability to save diffraction patterns for later reanalysis

Designed for metallurgy

  • Develop SEM-based methods for quality control and failure analysis
  • Perform phase identification and transformation analysis following heating and cooling
  • Identify phases and size grains
  • Monitor heat affected zones after welding
  • Run predictive fracture analysis in metals
  • Validate additive manufacturing processes


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Frequently asked questions (FAQs)

Citations & References