Nexsa G2 Surface Analysis System

Catalog number: IQLAADGACKFAQUMBJN

Nexsa G2 Surface Analysis System

Catalog number: IQLAADGACKFAQUMBJN
The Thermo Scientific™ Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.

Find additional information here: Nexsa G2 Surface Analysis System
 
Catalog Number
IQLAADGACKFAQUMBJN
Unit Size
Each
Item Description
Nexsa is a fully integrated XPS instrument, with optional additional analysis capabilities
Price (USD)
Full specifications
Sampling Area60 x 60 mm
X-Ray Spot Size10–400 µm (adjustable in 5 µm steps)
Analyzer Type180° double-focusing, hemispherical analyzer with 128-channel detector
Depth ProfilingEX06 monatomic ion source or MAGCIS dual-mode ion source
X-Ray Source TypeMonochromated, micro-focused, low power Al K-Alpha X-ray source
Optional AccessoriesUPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, NX sample heating module, sample bias module, vacuum transfer module, adaptor for glove box integration
Item DescriptionNexsa is a fully integrated XPS instrument, with optional additional analysis capabilities
Thickness (Metric) Max. Sample20 mm
Vacuum SystemTwo turbo molecular pumps, with automated titanium sublimation pump and backing pump
Unit SizeEach
Showing 1 of 1
Catalog NumberSpecificationsUnit SizeItem DescriptionPrice (USD)
IQLAADGACKFAQUMBJNFull specifications
EachNexsa is a fully integrated XPS instrument, with optional additional analysis capabilitiesRequest A Quote
Sampling Area60 x 60 mm
X-Ray Spot Size10–400 µm (adjustable in 5 µm steps)
Analyzer Type180° double-focusing, hemispherical analyzer with 128-channel detector
Depth ProfilingEX06 monatomic ion source or MAGCIS dual-mode ion source
X-Ray Source TypeMonochromated, micro-focused, low power Al K-Alpha X-ray source
Optional AccessoriesUPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, NX sample heating module, sample bias module, vacuum transfer module, adaptor for glove box integration
Item DescriptionNexsa is a fully integrated XPS instrument, with optional additional analysis capabilities
Thickness (Metric) Max. Sample20 mm
Vacuum SystemTwo turbo molecular pumps, with automated titanium sublimation pump and backing pump
Unit SizeEach
Showing 1 of 1
 
Powerful Performance from Standard Features: 
  • High-performance X-ray source
  • Optimized electron optics
  • Sample viewing
  • Insulator analysis
  • Digital Control
  • NX sample heater module

Optional Upgrades: Add any of the integrated and fully automated techniques to your analysis. Run at the touch of a button. 
  • ISS: Ion scattering spectroscopy is a technique in which a beam of ions is scattered by a surface
  • UPS: Ultraviolet photoelectron spectroscopy refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region
  • Raman: Spectroscopic technique used to in chemistry to provide a structural fingerprint
  • REELS: Reflection electron energy loss spectroscopy
 
SnapMap
 
Bring sample features into focus with SnapMap's optical view. The optical view helps you pint point areas of interest quickly while developing a fully focused XPS image to further define your experiment.
 
1. X-rays illuminate a small area on the sample.
2. Photo electrons from that small area are collected and focused into the analyzer
3. Spectra are continually acquired as the stage is moving
4. Stage position monitored throughout data acquisition, positions used to generate SnapMap 

Application Areas 
  • Batteries
  • Biosurfaces
  • Catalysts
  • Ceramics
  • Glass coatings
  • Graphene
  • Metals & oxides
  • Nanomaterials
  • OLEDs
  • Polymers
  • Semiconductors
  • Solar cells
  • Thin films
 

Figures

Frequently asked questions (FAQs)

Citations & References