Thermo Scientific™

Element™ GD Plus GD Mass Spectrometer

Related applications:

Industrial Mass Spectrometry

Discover how to redefine the analysis of advanced high purity materials directly from the solid with the Thermo Scientific™ Element GD™ Plus GD-MS. High sample throughput and extra low detection limits are provided with minimum calibration and sample preparation effort, making bulk metal analysis and depth profiling applications the domain for GD-MS.

Ceramics and several other nonconductive powders are analyzed by using a secondary electrode approach, providing the same level of sensitivity and data quality. Analysis of low melting point metals, such as gallium, is made easy with a dedicated workflow for sample preparation and analysis. This makes GD-MS the reliable standard method for trace metal analysis.

Back to top

Almost all elements present in a solid sample can be detected and quantified routinely: many down to the parts per billion (ppb) level.

µs-pulsed Fast Flow Glow Discharge Cell
  • High sensitivity ion source with pulsed discharge mode
  • Widely adjustable sputter rates for fast bulk analyses and advanced depth profiling applications
  • Alumina powder analysis by using a secondary electrode
Double-focusing Mass Spectrometer
  • Signal-to-noise ratios enabling sub-ppb detection limits based on high ion transmission combined with low background
  • Maximum level of selectivity and accuracy from high mass resolution: a prerequisite for undisputable analytical results
Twelve Orders of Magnitude Automatic Detection System
  • Determination of ultra-traces and matrix elements within a single analysis, as fully automatic detector covers 12 orders linear dynamic range
  • Direct determination of the matrix elements for IBR (Ion Beam Ratio) quantification
Software Suite for Productivity and Ease-of-use
  • Full computer control of all parameters
  • Fully automated tuning, analysis and data evaluation
  • Automatic LIMS connectivity
  • Remote control and diagnostic
  • Windows 10
  • Typically less than 10 minutes sample turn-around
  • Matrix to ultra-trace detection capabilities in a single analysis
  • Depth profiling from hundreds of micrometers down to single nanometers layer thickness
  • Minimum matrix effects for straightforward quantification
Recommended for:
  • Aerospace: nickel super alloys, composite materials, depth profiling of coatings and diffusion layers
  • Microelectronics: copper, alumina powder, sputter targets
  • Renewable energy: silicon blocks, wafers, solar cells
  • Medical/pharmaceutical/food: stainless steel, alloys

Optional Gallium Kit
The Element GD Plus GD-MS, equipped with the Gallium Kit, delivers the ideal workflow for routine industrial quality control analysis of gallium. The Gallium Kit comes with a hot plate for melting samples, PTFE molds for preparation of sample buttons, deep freezer box for solidification of sample buttons down to -50°C, exicator for sample storage and accessories such as pipettes and tips, storage, gloves, tweezers and sample beakers. In combination with new software features the Gallium Kit offers easy, clean, fast and reliable analysis of gallium.