Thermo Scientific™

Element™ GD Plus GD Mass Spectrometer

 Related applications: Industrial Mass Spectrometry

Discover how to redefine the analysis of advanced high purity materials directly from the solid with the Thermo Scientific™ Element GD™ Plus GD-MS. High sample throughput and extra low detection limits are provided with minimum calibration and sample preparation effort, making bulk metal analysis and depth profiling applications the domain for GD-MS.

Ceramics and several other nonconductive powders are analyzed by using a secondary electrode approach, providing the same level of sensitivity and data quality. This makes GD-MS the reliable standard method for trace metal analysis.

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Description

Almost all elements present in a solid sample can be detected and quantified routinely: many down to the parts per billion (ppb) level.

µs-pulsed Fast Flow Glow Discharge Cell
  • High sensitivity ion source with pulsed discharge mode
  • Widely adjustable sputter rates for fast bulk analyses and advanced depth profiling applications
  • Alumina powder analysis by using a secondary electrode
Double-focusing Mass Spectrometer
  • Signal-to-noise ratios enabling sub-ppb detection limits based on high ion transmission combined with low background
  • Maximum level of selectivity and accuracy from high mass resolution: a prerequisite for undisputable analytical results
Twelve Orders of Magnitude Automatic Detection System
  • Determination of ultra-traces and matrix elements within a single analysis, as fully automatic detector covers 12 orders linear dynamic range
  • Direct determination of the matrix elements for IBR (Ion Beam Ratio) quantification
Software Suite for Productivity and Ease-of-use
  • Full computer control of all parameters
  • Fully automated tuning, analysis and data evaluation
  • Automatic LIMS connectivity
  • Remote control and diagnostic
  • Windows 7
  • Typically less than 10 minutes sample turn-around
  • Matrix to ultra-trace detection capabilities in a single analysis
  • Depth profiling from hundreds of micrometers down to single nanometers layer thickness
  • Minimum matrix effects for straightforward quantification
Recommended for:
  • Aerospace: nickel super alloys, composite materials, depth profiling of coatings and diffusion layers
  • Microelectronics: copper, alumina powder, sputter targets
  • Renewable energy: silicon blocks, wafers, solar cells
  • Medical/pharmaceutical/food: stainless steel, alloys


Documents

Manuals & protocols