Redefine the analysis of advanced high purity materials directly in solid state with the Thermo Scientific™ Element GD Plus™ GD-MS. For high throughput and extra low ppb level detection limits, the Element GD Plus GD-MS is the most convenient and powerful tool for bulk metal analysis and depth profiling in routine and research applications.
The Element GD Plus GD-MS enables analysis of nearly all elements in the periodic table from both conductive and non-conductive materials with the same level of sensitivity and data quality. Analysis of low melting point metals such as gallium are made easy with a dedicated workflow for sample preparation and analysis. This makes GD-MS the reliable standard for any metal analysis.
|Type||GS Mass Spectrometer|
|Dynamic Range||>1012 Linear with Automatic Cross Calibration|
|Mass Resolution||3 Fixed Resolutions: ≥300, ≥ 4,000, ≥ 10,000|
|Mass Stability||25 ppm/8 hour|
|Power||3-Phase, 230/400 V ± 10%, 50/60 Hz Fused 32 A / Phase|
|Sensitivity||>1 x 1010 Cps (1.6 x 10-9 A) for Copper Peak (Peak Height, Total Ion Current) in Medium Resolution|
|Catalog Number||Specifications||Unit Size||Dynamic Range||Price (USD)|
|IQLAAEGAAMFABWMAFA||Each||>1012 Linear with Automatic Cross Calibration||Request A Quote|
Almost all elements present in a solid sample can be detected and quantified routinely: many down to the parts per billion (ppb) level.
High productivity and low cost of analysis
The Element GD Plus GD-MS is designed to deliver outstanding sensitivity and accuracy at a high sample throughput, dramatically lowering the cost of your analysis.
The Element GD Plus GD-MS is designed with routine operation and high throughput at its core.
Outstanding limits of detection
The Element GD Plus GD-MS delivers high throughput without compromise. With the highest signal-to-noise ratio and lowest limits of detection, the Element GD Plus GD-MS is the workhorse for ultra-high purity elemental analysis.
Trust in results by high mass resolution
The simplicity of high-resolution ICP-MS allows the most advanced performance, without compromising on straightforward and reliable method development.
Depth profiling with nanometer resolution
Depth profiling is an important tool for elemental analysis of coatings and the assessment of element diffusion across layers.