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Meridian™ 7 System for Semiconductors
The Thermo Scientific™ Meridian™ 7 system provides visible laser voltage imaging and probing and dynamic laser stimulation on sub-10nm devices. By avoiding a requirement for ultra-thin substrates, it preserves the integrity and functionality of the device under test to provide a reliable and practical production solution. It offers a 25 percent optical resolution enhancement over the previous-generation system and has a smaller spot size for better fault localization. In addition, the new Meridian 7 system offers more certainty in navigation and computer-aided design (CAD) overlay, less cross-talk and higher waveform signal-to-noise.
Dynamic Optical Fault Isolation for 10nm node and below
7 GHz bandwidth for at-speed tests
High resolution visible and Infrared light
High-yield sample preparation to 5μm widely available
EM Services for Semiconductors
Whether you are based in San Jose or Shanghai, our strategically located spare part warehouses allow field service engineers to immediately access the parts needed to keep your system running optimally