The Thermo Scientific™ Meridian™ S Inverted Static Optical Fault Isolation System enables Failure Analysis engineers in fabs and service labs to localize electrical faults in semiconductor devices. It offers high-sensitivity Static Laser Stimulation (IR-OBIRCH) and Photon Emission capabilities for the identification of electrical shorts and areas of leakage, in addition to the characterization of device activity via non-destructive analysis. The Meridian S System was designed for upgradability to higher sensitivity Photon Emission and Dynamic OFI techniques to maximize value and productivity.
Building on the long-standing success of the Meridian family, the next-generation Meridian S Inverted Static Optical Fault Isolation System enables localization of electrical fault root causes.
FDx with Active Probe
New probing architectures
Ease of Use
Laser Marker option
Whether you are based in San Jose or Shanghai, our strategically located spare part warehouses allow field service engineers to immediately access the parts needed to keep your system running optimally