The Metrios AX S/TEM is a first-of-its-kind S/TEM that uses machine learning to democratize automation in its application user interface (UI). The system removes barriers to automation by providing an intuitive workflow (Smart Automation) that is operable at the technician level for robust data acquisition on never-before-seen parts, in less than four hours for defined use cases.
With its Smart Alignment software, the Metrios AX S/TEM tracks current alignment state and position in the stability window (maintained in the background) to keep the tool aligned and consistently operating at specification.
Advanced imaging with S-CORR
With the new S-CORR probe corrector, sub-Angstrom STEM imaging resolution from 60 kV to 200 kV is easily achievable. The Metrios AX S/TEM is equipped with the Panther STEM (advanced STEM imaging), an entirely new, segmented STEM detection and data infrastructure unit. The new detector geometry offers access to advanced STEM imaging capability combined with the sensitivity and detectability to measure single electrons.
The Metrios AX S/TEM is designed for unprecedented ease of use and is ideal for both experienced microscopists and new users. The flexible UI allows for recipe-driven, fully automated metrology and acquisition, semi-automated operation, or manual data acquisition.