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nProber III System for Semiconductors
The Thermo Scientific™ nProber III system allows users to characterize individual transistor performance down to the 7nm node. nProber III system can also be used to localize a wide variety of electrical faults prior to extracting thin sectional samples for physical failure analysis in a transmission electron microscope (TEM). The high accuracy fault localization provided by the nProber III system can dramatically increase TEM fault imaging success rates. nProber III system productivity and ease of use make it an ideal solution for optimized failure analysis workflows.
Improve time to results with the most productive, easiest to use nanoprober on the market
Nanoprobing improves TEM efficiency by localizing faults prior to the lamella cut
Automated processes reduce the skill required to run the instrument
EM Services for Semiconductors
Whether you are based in San Jose or Shanghai, our strategically located spare part warehouses allow field service engineers to immediately access the parts needed to keep your system running optimally