The Thermo Scientific™ MK.1TE ESD and Static Latch-up Test System provides users with advanced capabilities to test midrange pin count devices to today’s Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design ensures recently identified waveform hazards in the standards, such as the trailing pulse and the pre-discharge voltage rise are addressed. Trailing pulses were shown to cause non-ESD related failures by exposing the DUT to an electrical overstress after the main HBM event. Pre-discharge voltage can cause voltage-triggered protection structures to fail, as the pin under test may not be at zero volts when the HBM event occurs. A user-selectable 10K Shunt can be connected during the pulse to eliminate any voltage prior to the actual HBM event. A combination test system, today’s MK.1 test system also performs Static Latch-Up testing per JEDEC’s EIA/JESD 78 method.
|Test Voltage Range||30 V to 1 kV (MM); 30 V to 8 kV (HBM)|
|Type||ESD Test System|
|Description||MK.1TE ESD and Static Latch-up Test System|
|Item Description||MK.1TE ESD and Static Latch-up Test System|
|Size (English)||22.8 in W x 30.5 in D x 39 in H|
|Size (Metric)||57.9 cm W x 77.5 cm D x 99.1 cm H|
Enhanced Data Set Features:
Report all data gathered for off-line reduction and analysis; core test data is readily available; all data is stored in an easy-to-manipulate standard XML file structure. Scimitar™ operating software provides intuitive test setup and operation and enhanced data set features.
|Catalog Number||Specifications||Unit Size||Description||Price (USD)|
|PIDESDMK1||Each||MK.1TE ESD and Static Latch-up Test System||Request A Quote|