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Thermo Scientific™
ESCALAB™ QXi X-ray Photoelectron Spectrometer (XPS) Microprobe
Catalog number: SID-10148252
Thermo Scientific™
ESCALAB™ QXi X-ray Photoelectron Spectrometer (XPS) Microprobe
Catalog number: SID-10148252
Meet your demands for increased analytical performance and flexibility with the Thermo Scientific™ ESCALAB™ QXi X-ray Photoelectron Spectrometer (XPS) Microprobe, which combines high spectral sensitivity and resolution with quantitative imaging and multi-technique capabilities.
Find additional information here: ESCALAB QXi X-ray Photoelectron Spectrometer (XPS) Microprobe
Catalog Number
SID-10148252
Unit Size
Each
Analyzer Type
180°, double-focusing, bi-polar hemispherical analyzer with dual detector system for spectroscopy and imaging
Depth Profiling
Monatomic EX06 ion source supplied as standard; option for MAGCIS dual mode ion source
Sampling Area
5-axis sample stage with sample heating and cooling capabilities
Optional fully automated sample exchange from load-lock parking post to analysis chamber
Optional fully automated sample exchange from load-lock parking post to analysis chamber
Price (USD)
| Sampling Area | 5-axis sample stage with sample heating and cooling capabilities Optional fully automated sample exchange from load-lock parking post to analysis chamber |
| X-Ray Source Type | Monochromated, Microfocused Al K-Alpha |
| X-Ray Spot Size | 200 to 900 μm |
| Analyzer Type | 180°, double-focusing, bi-polar hemispherical analyzer with dual detector system for spectroscopy and imaging |
| Depth Profiling | Monatomic EX06 ion source supplied as standard; option for MAGCIS dual mode ion source |
| Description | ESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe |
| Optional Accessories | Glove box, vacuum transfer vessel, EX03 broad beam ion source, platter camera |
| Options | UV lamp for UV photoelectron spectroscopy (UPS) Non-monochromated X-ray source for HAXPES Field emission electron source for Auger electron spectroscopy (AES) and SEM Inverse photoemission spectroscopy (IPES) EDS detector |
| Sampling Option | Heat/cool sample holder, additional preparation chamber, bakeable 3-gas admission manifold, fracture stage, sample parking facility |
| Thickness (Metric) Max. Sample | 12mm |
| Vacuum System | Two turbo molecular pumps for entry and analysis chambers, with rotary pumps or oil-free backing pumps; auto-firing, 3-filament titanium sublimation pump for analysis chamber |
| X-Ray Monochromator | Micro-focused Al K-Alpha source or optional micro-focused dual-anode Al K-Alpha and Ag L-Alpha source |
| Unit Size | Each |
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| SID-10148252 | Each | 180°, double-focusing, bi-polar hemispherical analyzer with dual detector system for spectroscopy and imaging | Monatomic EX06 ion source supplied as standard; option for MAGCIS dual mode ion source | 5-axis sample stage with sample heating and cooling capabilities Optional fully automated sample exchange from load-lock parking post to analysis chamber | Request A Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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Meet your demands for increased analytical performance and flexibility with the Thermo Scientific™ ESCALAB™ QXi X-ray Photoelectron Spectrometer (XPS) Microprobe, which combines high spectral sensitivity and resolution with quantitative imaging and multi-technique capabilities.
The ESCALAB QXi XPS Microprobe is an expandable and optimized multi-technique instrument with unparalleled flexibility and configurability. It is extremely sensitive, producing high-quality spectra in seconds. System control, data acquisition, processing, and reporting are seamlessly integrated in the powerful Thermo Scientific Avantage Data System. The cutting-edge technology, driven by intuitive software, guarantees world-class results and productivity. The ESCALAB QXi XPS Microprobe, with its unique dual detector system, also delivers superb XPS imaging with excellent spatial resolution.
The ESCALAB QXi X-ray Photoelectron Spectrometer (XPS) Microprobe features:
- Monochromated XPS
- Flood electron source
- Lens and analyzer
- Detectors
- Ion gun
- Digital Control
- Alignment and calibration
- Sample alignment
- Sample manipulator
- Vacuum system
- Preparation chambers
- Connectivity