The Themis S S/TEM benefits for Semiconductors include:
Fastest time to data
Themis S S/TEM achieves the fastest time to data by using a combination of the Piezo stage and drift corrected frame integration (DCFI) to compensate for possible specimen drift. This makes it possible to acquire high-quality high-resolution images in both TEM and STEM modes only minutes after sample loading.
To optimize productivity, Themis S S/TEM uses double-coil constant power lenses to minimize the thermal drift and maximize the system throughput. This design eliminates heating variation in the lens when switching between modes, such as changing from low-magnification mode for feature searching and high-magnification mode for imaging.