Evolution™ 350 UV-Vis Spectrophotometer

Número do catálogo: 840-310800

Evolution™ 350 UV-Vis Spectrophotometer

Número do catálogo: 840-310800

New sales of this model have been discontinued. Please see the newest models: the Evolution Pro Spectrophotometers.

 
Número do catálogo
840-310800
Tamanho da unidade
Each
Description
Evolution 350 Spectrophotometer
Especificações completas
Baseline Flatness±0.0015 A (200 to 800 nm), 2.0 nm SBW, smoothed
Beam Center Height8.5 mm
DescriptionEvolution 350 Spectrophotometer
Detector TypeDual Matched Silicon Photodiodes
Dimensions (L x W x H)53 x 61 x 38 cm (20.8 x 24 x 14.9 in.)
Light SourceXenon Flash
Spectral Bandwidth0.5, 1.0, 1.5, 2.0, 4.0 nm Selectable
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz
For Use With (Application)Academic, Chemicals, Food & Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals
Lamp Life>5 years or longer if not using live signal
NoisePhotometric
0A: <0.00018 A
1A: <0.00022 A
2A: <0.00050 A
500 nm, 2.0 nm SBW, RMS
Optical DesignModified Ebert; Double beam with sample and reference cuvette/accessory positions
Pharmacopoeia Compliance TestingWavelength Accuracy: ±0.3 nm 190–900 nm
Wavelength Repeatability: SD 10 meas. <0.1 nm
Absorbance Accuracy: <±0.010A at 1A, <±0.010A at 2A
Absorbance Repeatability: ±0.0025A @ 1A
Stray Light: 198 nm with KCl >2A, 220 nm with NaI >3A, 300 nm with acetone >3A, 340 nm with NaNO2 >3A Resolution: Peak/trough ratio >1.8 @ 1 nm SBW setting
Photometric Accuracy1 A: ±0.004 A, 2 A: ±0.004 A,3 A: ±0.006 A
Photometric Display±6 A
Photometric Range>4 A
Photometric Repeatability1 A: ±0.0025 A
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk,
Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative
Scan SpeedVariable, up to 6000 nm/min.
Stray Light198 nm: 2.4 A KCl
220 nm: 3.5 A NaI
340 nm: 4.0 A NaNO2
Warranty3-year Source Replacement Warranty
Wavelength Accuracy±0.20 nm (546.11 nm Hg emission line), ±0.30 nm, 190 to 900 nm
Wavelength Data Interval10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm
Wavelength RepeatabilityStandard deviation of 10 measurements <0.05 nm
Weight (English)48.5 lb.
Weight (Metric)22 kg
Unit SizeEach
Número do catálogo
Tamanho da unidade
Each
Description
Evolution 350 UV-Vis Spectrophotometer with Mercury lamp
Especificações completas
Baseline Flatness±0.0015 A (200–800 nm) 2.0 nm SBW, smoothed
Beam Center Height8.5 mm
Certifications/ComplianceCertificate of Analysis (COA), Certificate of Conformance (COC)
DescriptionEvolution 350 UV-Vis Spectrophotometer with Mercury lamp
Detector TypeDual Matched Silicon Photodiodes
Dimensions (L x W x H)53 x 61 x 38 cm (20.8 x 24 x 14.9 in.)
Light SourceXenon Flash/Mercury Vapor Lamp
Product LineEvolution 350
Spectral Bandwidth0.5, 1.0, 1.5, 2.0, 4.0 nm Selectable
TypeUV-Vis Spectrophotometer with Mercury Lamp
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz
For Use With (Application)Academic, Chemicals, Food & Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals
Lamp Life>5 years or longer if not using live signal
NoisePhotometric
0A: <0.00018 A
1A: <0.00022 A
2A: <0.00050 A
500 nm, 2.0 nm SBW, RMS
Optical DesignModified Ebert; Double beam with sample and reference cuvette/accessory positions
Pharmacopoeia Compliance TestingWavelength Accuracy: ±0.3 nm 190–900 nm
Wavelength Repeatability: SD 10 meas. <0.1 nm
Absorbance Accuracy: <±0.010A at 1A, <±0.010A at 2A
Absorbance Repeatability: ±0.0025A @ 1A
Stray Light: 198 nm with KCl >2A, 220 nm with NaI >3A, 300 nm with acetone >3A, 340 nm with NaNO2 >3A
Resolution: Peak/trough ratio >1.8 @ 1 nm SBW setting
Photometric Accuracy1 A: ±0.004 A, 2 A: ±0.004 A, 3 A: ±0.006 A, Measured at 546 nm
Photometric Display±6 A
Photometric Range>4 A
Photometric Repeatability1 A: ±0.0025 A
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative
Scan SpeedVariable, up to 6000 nm/min.
Stray Light198 nm: 2.4 A KCl
220 nm: 3.5 A NaI
340 nm: 4.0 A NaNO2
Warranty3-year Source Replacement Warranty
Wavelength Accuracy±0.20 nm (546.11 nm Hg emission line), ±0.30 nm, 190 to 900 nm
Wavelength Data Interval10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm
Wavelength RepeatabilityStandard deviation of 10 measurements <0.05 nm
Weight (English)48.5 lb.
Weight (Metric)22 kg
Unit SizeEach
Mostrando 2 de 2
Número do catálogoEspecificaçõesTamanho da unidadeDescriptionPreço (BRL)
840-310800Especificações completas
EachEvolution 350 SpectrophotometerEntre em contato ›
Baseline Flatness±0.0015 A (200 to 800 nm), 2.0 nm SBW, smoothed
Beam Center Height8.5 mm
DescriptionEvolution 350 Spectrophotometer
Detector TypeDual Matched Silicon Photodiodes
Dimensions (L x W x H)53 x 61 x 38 cm (20.8 x 24 x 14.9 in.)
Light SourceXenon Flash
Spectral Bandwidth0.5, 1.0, 1.5, 2.0, 4.0 nm Selectable
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz
For Use With (Application)Academic, Chemicals, Food & Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals
Lamp Life>5 years or longer if not using live signal
NoisePhotometric
0A: <0.00018 A
1A: <0.00022 A
2A: <0.00050 A
500 nm, 2.0 nm SBW, RMS
Optical DesignModified Ebert; Double beam with sample and reference cuvette/accessory positions
Pharmacopoeia Compliance TestingWavelength Accuracy: ±0.3 nm 190–900 nm
Wavelength Repeatability: SD 10 meas. <0.1 nm
Absorbance Accuracy: <±0.010A at 1A, <±0.010A at 2A
Absorbance Repeatability: ±0.0025A @ 1A
Stray Light: 198 nm with KCl >2A, 220 nm with NaI >3A, 300 nm with acetone >3A, 340 nm with NaNO2 >3A Resolution: Peak/trough ratio >1.8 @ 1 nm SBW setting
Photometric Accuracy1 A: ±0.004 A, 2 A: ±0.004 A,3 A: ±0.006 A
Photometric Display±6 A
Photometric Range>4 A
Photometric Repeatability1 A: ±0.0025 A
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk,
Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative
Scan SpeedVariable, up to 6000 nm/min.
Stray Light198 nm: 2.4 A KCl
220 nm: 3.5 A NaI
340 nm: 4.0 A NaNO2
Warranty3-year Source Replacement Warranty
Wavelength Accuracy±0.20 nm (546.11 nm Hg emission line), ±0.30 nm, 190 to 900 nm
Wavelength Data Interval10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm
Wavelength RepeatabilityStandard deviation of 10 measurements <0.05 nm
Weight (English)48.5 lb.
Weight (Metric)22 kg
Unit SizeEach
912A0959Especificações completas
EachEvolution 350 UV-Vis Spectrophotometer with Mercury lampEntre em contato ›
Baseline Flatness±0.0015 A (200–800 nm) 2.0 nm SBW, smoothed
Beam Center Height8.5 mm
Certifications/ComplianceCertificate of Analysis (COA), Certificate of Conformance (COC)
DescriptionEvolution 350 UV-Vis Spectrophotometer with Mercury lamp
Detector TypeDual Matched Silicon Photodiodes
Dimensions (L x W x H)53 x 61 x 38 cm (20.8 x 24 x 14.9 in.)
Light SourceXenon Flash/Mercury Vapor Lamp
Product LineEvolution 350
Spectral Bandwidth0.5, 1.0, 1.5, 2.0, 4.0 nm Selectable
TypeUV-Vis Spectrophotometer with Mercury Lamp
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz
For Use With (Application)Academic, Chemicals, Food & Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals
Lamp Life>5 years or longer if not using live signal
NoisePhotometric
0A: <0.00018 A
1A: <0.00022 A
2A: <0.00050 A
500 nm, 2.0 nm SBW, RMS
Optical DesignModified Ebert; Double beam with sample and reference cuvette/accessory positions
Pharmacopoeia Compliance TestingWavelength Accuracy: ±0.3 nm 190–900 nm
Wavelength Repeatability: SD 10 meas. <0.1 nm
Absorbance Accuracy: <±0.010A at 1A, <±0.010A at 2A
Absorbance Repeatability: ±0.0025A @ 1A
Stray Light: 198 nm with KCl >2A, 220 nm with NaI >3A, 300 nm with acetone >3A, 340 nm with NaNO2 >3A
Resolution: Peak/trough ratio >1.8 @ 1 nm SBW setting
Photometric Accuracy1 A: ±0.004 A, 2 A: ±0.004 A, 3 A: ±0.006 A, Measured at 546 nm
Photometric Display±6 A
Photometric Range>4 A
Photometric Repeatability1 A: ±0.0025 A
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative
Scan SpeedVariable, up to 6000 nm/min.
Stray Light198 nm: 2.4 A KCl
220 nm: 3.5 A NaI
340 nm: 4.0 A NaNO2
Warranty3-year Source Replacement Warranty
Wavelength Accuracy±0.20 nm (546.11 nm Hg emission line), ±0.30 nm, 190 to 900 nm
Wavelength Data Interval10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm
Wavelength RepeatabilityStandard deviation of 10 measurements <0.05 nm
Weight (English)48.5 lb.
Weight (Metric)22 kg
Unit SizeEach
Mostrando 2 de 2

New sales of this model have been discontinued. Please see the newest models: the Evolution Pro Spectrophotometers.

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