사양
베이스라인 평탄도<0.003 A, 325 to 1000 nm smoothed
컴파트먼트Accessible from top, front or side
Able to accommodate cells up to 100mm pathlength
Available accessory for test-tubes up to 25mm diameter and 150mm height
Removable, washable sample compartment liner with magnetic placement and hold-down
연결USB-A, USB-B
치수(길이 x 폭 x 높이)35.5x 38.5x 19.5 cm
드리프트<0.002 A/hr. (At 500 nm after 2 hr. warmup.) Typical <0.004 A/hr. after 1 hr. warmup
전기 요구사항External AC to DC converter. Voltage and Frequency (Hz) selected automatically, 100/250 V, 50/60 Hz
포함GENESYS 30 EU power cable
키패드Tactile rubber 23 keys with numeric keypad
램프 수명1000 hrs.
노이즈≤0.001A at 0A
≤0.001A at 1A
≤0.002A at 2A
RMS at 500nm. 60 consecutive measurements
광학 디자인Single Beam
광도 정확도±0.002 A (0 to 0.3 A), 0.5% of ABS reading (0.301 A to 2.5 A)
광도 디스플레이-3A to +3A, 0 to 200 000 %T, 0 to 9 999 999 C
광도 범위-3A to +3A
광도 반복성± 0.002 A
Measured at 1.0 A at 546 nm
프린터 포함Thermal printer accessory with 80 mm width paper
스캔 속도Automatic – up to 1200 nm/min.
미광<0.1%T at 340 nm and 400 nm
Measured using glass cutoff filters or NaNO2 at 340 nm
워런티2 yrs std + 1 yr ext upon reg
파장 정확도±2 nm
파장 데이터 간격1 nm
파장 반복성< ±1 nm
중량(미터법)7.5 kg
검출기 유형Silicon Photodiode
디스플레이5 in. 32-bit Color Display, 800 x 480 pixels
언어English, French, German, Spanish, Italian, Portuguese, Russian, Chinese, Japanese, Korean, Thai, Arabic
Wavelength Range325 to 1100 nm
Unit SizeEach