사양
베이스라인 평탄도±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
인증/적합성ISO 9001:2008
연결USB or RS-232
깊이(영국식 단위)24.3 in.
깊이(미터법)62.2 mm
설명Evolution 201 Tablet Control Module US, CAN, JP
치수(길이 x 폭 x 높이)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
드리프트<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
전기 요구사항100/240 V, 50/60 Hz selected automatically, 150 W maximum
보유Cuvettes up to 100 mm
키패드Sealed membrane
램프 수명7 years typical
노이즈0A: <0.00015A;
1A:<0.00025A;
2A: <0.00080A;
260nm, 1.0nm SBW, RMS
광학 디자인Double Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
약전 규정 준수 검사Resolution (Toluene in Hexane): ≥1.8A
Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl
Wavelength Accuracy: ±.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range
Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line
광도 디스플레이-0.3 to 4.0A
광도 범위>3.5A
광도 반복성±0.0002 A
프로세서INSIGHT 2 Software is compatible with Windows™ 7 and Windows 8.1 Professional Editions
스캔 좌표 모드Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
스캔 속도<1 to 6000 nm/min. (Variable)
워런티3 Years
와트150 W max.
파장 정확도±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
파장 데이터 간격10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
파장 반복성≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
중량(미터법)14.4 kg
검출기 유형Dual Silicon Photodiodes
디스플레이No Display
제품라인Evolution 201
스펙트럼 대역폭1 nm
유형Spec,Tablet Module - NA, JP
Wavelength Range190 to 1100 nm
Unit SizeEach