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Electron backscatter diffraction for advanced materials characterization
Electron backscatter diffraction (EBSD) is a microstructural characterization technique that provides crystallographic information such as grain orientation, phase distribution, and local strain. By revealing crystal orientations, identifying phases, and mapping grain structures, EBSD is especially valuable in industrial applications where properties like strength, corrosion resistance, and coating performance are closely linked to microstructure and processing conditions.
Example of different maps (forescatter image, grain map, inverse pole figure maps X-Y-Z, and phase) acquired from a titanium aluminum alloy using EBSD analysis.
The Thermo Scientific TruePix EBSD Detector delivers a new level of EBSD analysis. Together with the dedicated xTalView Software Suite, it provides crystallographic information quickly, precisely, and easily.
Integrating EBSD with scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS), as provided by the Thermo Scientific Apreo ChemiSEM System, offers a powerful, multidimensional approach to materials characterization. It enables a comprehensive understanding of a material’s microstructure and allows for precise correlation between structure, composition, and material properties, which are critical for failure analysis, quality control, and advanced research and development.
Schematic of complimentary analysis with EM imaging, EDS analysis, and EBSD analysis.
TruePix EBSD Detector features
The TruePix Detector integrates with SEM and EDS workflows to streamline and simplify complex analyses.
EBSD applications
EBSD can provide crystallographic insights for fields ranging from materials science and geology to engineering and metallurgy.
For Research Use Only. Not for use in diagnostic procedures.