X-Ray Photoelectron Spectroscopy Resources

On-demand

Speaker: Robin Simpson

Are you ready to delve into the advanced capabilities of X-ray Photoelectron Spectroscopy (XPS) for surface analysis? Join us for an exclusive webinar where Robin Simpson, application scientist from Thermo Fisher Scientific, will guide you through the revolutionary features and applications of the Thermo Scientific™ K-Alpha™ XPS System.

Since its launch, the K-Alpha has transformed XPS from a complex, specialist technique into a routine tool for material analysis. In this webinar, you will discover how this powerful system can address your critical surface and interfacial chemistry questions by offering high throughput, ease of use, and exceptional performance.

What you will learn:

• Introduction to the K-Alpha XPS System: Discover the unique features that make the K-Alpha a game-changer in surface analysis.
• High-performance capabilities: Learn about the high-performance X-ray source, spectrometer, dual beam charge compensation system, and monatomic argon ion beam for depth profiling.
• Case studies and applications: Explore real-world examples and case studies showcasing the K-Alpha's versatility in various material science applications.
• User-friendly operation: Understand how the Avantage data system simplifies the analysis process, making it accessible for routine use.

On-demand

Speaker: Robin Simpson, Thermo Fisher Scientific

Are you ready to explore advanced capabilities of X-ray Photoelectron Spectroscopy (XPS) for surface analysis? Join us for an exclusive webinar where Robin Simpson, EngD, an esteemed application scientist from Thermo Fisher Scientific, will present the Thermo Scientific™ Nexsa™ G2 XPS System.

In this webinar, you will learn how the Nexsa G2 system integrates multiple complementary techniques to provide comprehensive surface analysis. This system enhances high performance, high throughput, and usability with advanced capabilities such as Raman spectroscopy, UPS, and ISS, making it a versatile tool for material scientists.

What you will learn:

• Introduction to Nexsa G2 XPS System: Discover the unique features and capabilities that set the Nexsa G2 apart.
• Multi-technique analysis: Learn how the Nexsa G2 integrates Raman spectroscopy, UPS, ISS, and more for comprehensive surface analysis.
• Advanced applications: Explore case studies demonstrating the system's application in analyzing complex material surfaces.
• User-friendly operation: Understand how the automated workflows and the Avantage software streamline the analysis process.

On-demand

Join us for an exclusive on-demand webinar where Robin Simpson, our expert guide, will introduce you to the cutting-edge Thermo Scientific ESCALAB QXI XPS System. Built on 50 years of experience and expertise, it delivers fully automated sample exchange, advanced spectroscopy capabilities, and publication-quality data quickly and efficiently.

You’ll learn:

• Key features of the ESCALAB QXI XPS System, including automated workflows and high-resolution imaging
• How to optimize sample throughput and achieve high-quality data
• Real-world applications and case studies demonstrating the system's capabilities

On-demand

Choosing the right combination of analytical techniques is crucial for surface analysts. X-ray photoelectron spectroscopy (XPS) is the foundation of surface analysis, but additional methods are often necessary to complete the experiment.

The Thermo Scientific Nexsa Surface Analysis System and the Thermo Scientific ESCALAB Xi+ XPS Microprobe can synchronize XPS analysis with other analytical techniques for a more comprehensive analysis.

In this webinar, you will be introduced to these additional techniques and learn how they can be used with XPS to build a comprehensive understanding of material surfaces.

In this session, you will discover:

• The fundamentals of ion scattering spectroscopy (ISS), reflected electron energy loss spectroscopy (REELS), UV photoelectron spectroscopy (UPS), Auger electron spectroscopy (AES), and Raman spectroscopy
• How the additional information provided by these techniques complements XPS analysis
• The simplicity of running an analysis on the Nexsa Surface Analysis System
• Examples highlighting the advantages of combining different techniques for more comprehensive insights