Thermo Fisher Scientific In-booth Presentations at Microscopy and Microanalysis 2025

Unveiling a new DualBeam FIB-SEM: A revolutionary platform for ultra-high-resolution subsurface exploration  

12:00 p.m. to 12:30 p.m.
Presented by TBD

We are proud to announce the launch of a new Thermo Scientific DualBeam FIB-SEM, a state-of-the-art, next-generation platform engineered to transform subsurface exploration. This ultra-high-resolution system is designed for fully automated acquisition of high-quality and high-throughput data. Key features include seamless multi-sample and multi-site automation for unattended data collection, encompassing milling, multi-modal imaging, and data processing via Python with AutoScript Software. With enhanced milling throughput enabled by a 100nA FIB current and optimized electron optics, this DualBeam FIB-SEM is a versatile and high-performance solution for comprehensive analytical needs.
 

Advancements in 120kV TEM acquisition and analysis for large-area cell and tissue imaging, protein structure determination, and nanoparticle characterization

12:30 p.m. to 1:00 p.m.

Presented by Tim Booth

Traditional 120kV TEM imaging is crucial for ultrastructural analyses of cells, tissues, and proteins. Efficient and reproducible dataset acquisition is essential for life sciences and clinical research. This session will introduce advancements in 120kV TEM hardware and software with improved accessibility and automation, including AI-assisted data analysis. Our automated package enables high-throughput, unattended multi-scale imaging. New AI-enhanced workflows accelerate nanoparticle data analysis under cryogenic conditions, improving data accuracy and productivity. Explore these advancements that make TEM technology more accessible and efficient.
 

Pushing the boundaries of what’s possible with cryo-electron microscopy on the new Krios 5 Cryo-TEM

1:00 p.m. to 1:30 p.m.

Presented by Eliza Nieweglowska

Discover the newest advancements in enabling 3D visualizations of proteins and macromolecules and their interactions and spatial locations within the cell. In this session, we will showcase how the new Thermo Scientific Krios 5 Cryo-TEM can help you achieve higher quality results as well as faster single particle analysis and tomography. You will not want to miss the opportunity to be one of the first to hear about this exciting new technology.
 

From STEM to automated scientist with AutoScript Software

2:00 p.m. to 3:00 p.m.

Guest Speaker: Sergei Kalinin -UTN Knoxville

Microscopic milestones: How services help support the full life of your EM instrument

3:00 p.m. to 3:30 p.m.

Presented by Michelle Plue and Rhett Johnson  

Learn about our comprehensive support services designed to extend the life and enhance the performance of your electron microscope. From space preparation, installation, and ongoing use to eventual resale or buyback, our services ensure you receive maximum return on your investment.
 

Expanding the frontiers of cellular imaging: AI assisted FIB-SEM workflows with Hydra Bio Plasma-FIB

3:30 p.m. to 4:00 p.m.

Presented by Alex Rigort

Integrating AI into volume electron microscopy (vEM) can automate processes, enhance precision, and speed up data acquisition. The Thermo Scientific Hydra Bio Plasma-FIB system, using adaptive scanning driven by AI, selectively captures high-resolution data from areas of interest, reducing overall acquisition time while maintaining context. In addition, AI-driven real-time analysis adjusts imaging parameters for cryo-prepared specimens, improving large-scale volume acquisition.

Apreo ChemiSEM System: Smarter imaging and direct electron detection EBSD for material characterization

10:00 a.m. to 10:30 a.m.

Presented by Chris Stephens

In this session, we will present the latest advancements in material characterization using the Thermo Scientific Apreo ChemiSEM System, focusing on its Trinity detection system, direct electron detection for EBSD, and real-time elemental analysis with integrated EDS. The Trinity detection system, with three in lens detectors leveraging advanced column design, provides multiple imaging modalities for optimal contrast and resolution across a wide range of material types, including amorphous, non-conductive, and porous structures. The talk will also explore dedicated Smart Imaging strategies and automated real-time image optimization techniques. Additionally, we will discuss the integration of automated analytical workflows for materials science applications, including real-time EDS elemental mapping. Finally, we will introduce TruePix-based electron counting, which enables systematic diffraction pattern analysis by detecting every electron above a threshold. We’ll highlight low-kV direct electron detection EBSD, demonstrating its benefits for beam-sensitive materials and high-resolution crystallographic analysis. We will also define the median electron count (MEC) metric in EBSP, examining its applications in both SEM imaging and the characterization of 2D material layer thicknesses.
 

Advancements in 120kV TEM acquisition and analysis for large-area cell and tissue imaging, protein structure determination, and nanoparticle characterization

12:00 p.m. to 12:30 p.m.

Presented by Tim Booth

Traditional 120kV TEM imaging is crucial for ultrastructural analyses of cells, tissues, and proteins. Efficient and reproducible dataset acquisition is essential for life sciences and clinical research. This session will introduce advancements in 120kV TEM hardware and software with improved accessibility and automation, including AI-assisted data analysis. Our automated package enables high-throughput, unattended multi-scale imaging. New AI-enhanced workflows accelerate nanoparticle data analysis under cryogenic conditions, improving data accuracy and productivity. Explore these advancements that make TEM technology more accessible and efficient.

Expanding the Frontiers of Cellular Imaging: AI assisted FIB-SEM Workflows with Hydra Bio Plasma-FIB

12:30 p.m. to 1:00 p.m.

Presented by Alex Rigort

Integrating AI into volume electron microscopy (vEM) can automate processes, enhance precision, and speed up data acquisition. The Thermo Scientific Hydra Bio Plasma-FIB system, using adaptive scanning driven by AI, selectively captures high-resolution data from areas of interest, reducing overall acquisition time while maintaining context. In addition, AI-driven real-time analysis adjusts imaging parameters for cryo-prepared specimens, improving large-scale volume acquisition.
 

Easy correlation of SEM and XPS data with the CISA Workflow

1:00 p.m. to 1:30 p.m.

Presented by Richard White

Understanding both the chemistry and structure of surfaces can be key to understanding how they behave in an application. Join us to see how Thermo Scientific Maps Software can help you combine data from XPS instruments, such as the Thermo Scientific Nexsa G2 Surface Analysis System, with SEM images. We'll show just how easy it is to correlate the data from the two instruments using our dedicated Thermo Scientific CISA Workflow.
 

Tutorial: Tips and tricks for getting the most from your Talos TEM

2:00 p.m. to 3:00 p.m.

Presented by Joseph Cline

This tutorial showcases the features and workflows on the Thermo Scientific Talos TEM that lower the barrier to high-quality data acquisition for new users while boosting efficiency for experienced operators. High-stability optics and next-generation automation simplify tasks like sample orientation, beam alignments, and real-time quantification of sample chemistry, helping users achieve reliable results faster and with less effort.
 

Iliad (S)TEM technology: The next-generation answer to semiconductor R&D challenges

3:00 p.m. to 3:30 p.m.

Presented by Dominique Delille

The innovative Thermo Scientific Iliad (S)TEM revolutionizes transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) by acquiring correlated data at different voltages within a single microscopy session through live high tension (HT) switching. Traditionally, optimizing imaging for energy-dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) required separate sessions due to the need for different voltages.

The fully integrated Iliad (S)TEM features the advanced Iliad EELS Spectrometer and Energy Filter, a dedicated Zebra detector, and the Ultra-X EDS Detector, which provides record-breaking solid angle. Additionally, the system includes the NanoPulser electrostatic beam blanker and live HT switching, which collectively revolutionize TEM.

Integrated Thermo Scientific Velox Software facilitates seamless data acquisition, and Thermo Scientific AutoScript Software enables customized workflows that simplify operation and support a wide range of applications. The next generation of Thermo Fisher Scientific’s (S)TEMs for semiconductor applications will also incorporate a dedicated 4D STEM solution for high-speed acquisition of differential phase contrast (DPC) and integrated differential phase contrast (iDPC) imaging. This will include diffractive imaging for mapping electric and magnetic fields, imaging of light and heavy materials down to atomic resolution, and mapping of strain, phase, and orientation with sub-nanometer resolution.
 

The Thermo Scientific IGST Workflow: Observe air-sensitive materials in their native state

3:30 p.m. to 4:00 p.m.

Presented by Zhao Liu

Most materials used in clean energy applications are sensitive to air and water, especially battery materials. The Thermo Scientific IGST (Inert Gas Sample Transfer) Workflow protects your samples so you can focus on your research rather than look for sample contamination due to improper sample handling. In this talk, we will introduce the IGST Workflow and discuss the Thermo Scientific CleanConnect System as well as its features and applications.
 

Tutorial: Combined light and electron beam techniques with the Attolight Mönch

4:00 p.m. to 5:00 p.m.

Guest Speaker: Nicholas Morgan - Attolight

In this tutorial, Attolight will introduce the Mönch, an integrated light collection and injection module for STEM microscopes. Using precision-engineered optical components and a design that’s been optimized for usability, the Mönch enables a wide range of in-STEM experiments, including CL spectroscopy and optical pumping with a laser. Join us to learn how the module integrates with Thermo Scientific STEMs.

Microscopic milestones: How services help support the full life of your EM instrument

10:00 a.m. to 10:30 a.m.

Presented by Michelle Plue and Rhett Johnson

Learn about our comprehensive support services designed to extend the life and enhance the performance of your electron microscope. From space preparation, installation, and ongoing use to eventual resale or buyback, our services ensure you receive maximum return on your investment.
 

Deep learning and image analysis with Amira and Avizo Software

12:00 p.m. to 12:30 p.m. and 12:30 p.m. to 1:00 p.m.

Presented by Rengarajan Pelapur

While EM images aid in understanding cellular architecture, porous structures, and semiconductors, quantifying these features presents a unique challenge that requires segmenting extremely large volumes of data. Often, these images can’t be segmented using traditional image processing techniques like intensity-based thresholding. Thermo Scientific Amira and Avizo Software include a suite of deep learning tools that provide an effective solution for visualizing, segmenting, and comprehending images. Our advanced image processing toolboxes can help you uncover insights into micro- and nanostructures that would be inaccessible with 2D images alone. With a user-friendly interface and comprehensive machine learning tools, Avizo and Amira Software optimize workflows to help you dedicate your efforts to advancing your field of study.
 

Pushing the boundaries of what’s possible with cryo-electron microscopy on the new Krios 5 Cryo-TEM

1:00 p.m. to 1:30 p.m.

Presented by Eliza Nieweglowska

Discover the newest advancements in enabling 3D visualizations of proteins and macromolecules and their interactions and spatial locations within the cell. In this session, we will showcase how the new Thermo Scientific Krios 5 Cryo-TEM can help you achieve higher quality results as well as faster single particle analysis and tomography. You will not want to miss the opportunity to be one of the first to hear about this exciting new technology.
 

Advancing multimodal analytics on Talos TEM

2:00 p.m. to 3:00 p.m.

Presented by Lee Casalena

Learn to use the broad range of techniques available on Thermo Scientific Talos TEMs. We will explain how to use the microscope to collect data in various modes, how to collect EDX results, and how to run the workflows automation using Thermo Scientific AutoScript Software.  

Revolutionizing semiconductor sample preparation with ion source technology

3:00 p.m. to 3:30 p.m.

Presented by Jake Jensen

In this session, we will present the performance advantages of argon, oxygen, and xenon as plasma-focused ion beam (PFIB) sources to accelerate semiconductor materials analysis. We will also show how to utilize different ion sources to advance cross-sectioning of dissimilar materials, planarizing metal and dielectric layers, and preparing Ga-free lamella. Lastly, we will share the latest advancements in high-volume milling rates for failure analysis and metrology.