Instruments, devices, and accessories designed to facilitate accurate elemental analysis via x-ray fluorescence. Products are available in a variety of sizes and configurations including benchtop spectrometers and portable, hand-held analyzers.
Elemental Analysis (3)
Identify low alloy/carbon, L grade, and H grade steels (1)
Identify pure metals and alloys, detect tramp elements, or obtain geochemical data (1)
Non-destructive method to test the purity and chemistry of precious metals (2)
Raw Material Testing (1)
Sample Identification, Positive Material Identification (1)
Automation (1)
Calibration Package (1)
EDXRF Spectrometer (1)
Simultaneous-Sequential XRF Spectrometer (3)
WDXRF Spectrometer (1)
XRF Instrument (2)
Geometrically Optimized Large Area Drift Detector (1)
High count rate, high resolution, extra large area silicon drift detector (1μm graphene window). Detector ProGuard protection included. (1)
High-performance Semiconductor (4)
High-performance Si-PIN semiconductor (1)
Proprietary Large Area Drift Detector (1)
Silicon Drift Detector (SDD) Detector ProGuard protection included (1)
Data Storage: 512 MB internal system memory / 16 GB industrial grade storage; Stores approximately 130,000 readings with spectra (fewer if macro and micro images are saved). Data Transfer: WiFi, USB-c. Description: Niton XL5 Plus Handheld XRF Analyzer. Detector Type: High count rate, high resolution, extra large area silicon drift detector (1μm graphene window). Detector ProGuard protection included.
Applications: Elemental Analysis. Available Analytical Modes: Varies by application:Alloy Modes: Metal Alloy, Electronics Alloy, Precious MetalsBulk Modes: Mining, SoilPlastic Modes: RoHS Plastics, Toy and Consumer Goods Plastics,TestAll™, Painted ProductsCustom Modes: Upon request (based on application feasibility). Data Memory: 64 MB internal system memory/128 MB internal user storage. Data Storage: Internal >10,000 readings with spectra.
Applications: Identify pure metals and alloys, detect tramp elements, or obtain geochemical data. Analytical Range: Mg-U. Available Analytical Modes: General Metals, Precious Metals, Coatings, Mining, Soils, Electronic Alloys, Plastics, Industrial Lead in Paint, Lead in Paint Products. Data Storage: 64 MB internal system memory / 128 MB internal user storage Stores approximately 10,000 readings with spectra (fewer if images are saved).
Applications: Non-destructive method to test the purity and chemistry of precious metals. Data Memory: 64MB internal system memory/ 128MB internal user storage. Data Storage: Internal >10,000 readings with spectra. Data Transfer: USB.
Applications: Sample Identification, Positive Material Identification. Analytical Range: Up to 30 elements from Mg to U (varies by application). Available Analytical Modes: Varies by application:Alloy Modes: Metal Alloy, Electronics Alloy, Precious MetalsBulk Modes: Soil, Mining, TestAllPlastic Modes: RoHS Plastics, Toy and Consumer Goods, Plastics, TestAll, Painted ProductsCustom Modes: Upon request (bas. Data Memory: 32MB internal system memory/128 MB internal user storage.
Applications: Elemental Analysis. Analytical Range: 25 elements from Ti to Bi. Available Analytical Modes: Alloy Modes: Metal Alloy. Data Storage: Internal >10,000 readings with spectra.
Applications: Non-destructive method to test the purity and chemistry of precious metals. Available Analytical Modes: Varies by application. Alloy modes: metal alloy, electronics alloy, precious metals. Bulk modes: mining, soil. Plastic modes: RoHS plastics, toy and consumer goods plastics, Thermo Scientific TestAll, painted products. Custom modes: upon request Data Memory: 64MB internal system memory/128MB internal user storage. Data Storage: Internal >10,000 readings with spectra.
Save money and achieve quality control in your industrial process with full simultaneous and sequential capabilities integrated into one instrument. The Thermo Scientific™ ARL™ 9900 Simultaneous-Sequential XRF Series can be equipped with the innovative SmartGonio goniometer for simple,...
Type: Simultaneous-Sequential XRF Spectrometer. Description: WDXRF analyzer with XRD capability for quick, precise elemental analysis for the minerals and mining, cement and metals industries to enable industrial process controls. Includes: OXSAS™ Analytical Software.
Applications: Raw Material Testing. Data Storage: 512 MB internal system memory/16 GB industrial grade storage Stores approximately 130,000 readings with spectra (fewer if macro and micro images are saved). Data Transfer: Wi-Fi, USB. Detector Type: Proprietary Large Area Drift Detector.
Fast, reliable elemental analysis—in the lab and field We offer a wide range of X-ray fluorescence (XRF) instruments designed to meet the needs of every industry. Our robust family of Thermo ScientificARL XRF spectrometers provides fast, repeatable elemental analysis measurements with little to no...