Electron Microscopes

Electron microscopes are high-magnification microscopy instruments used to obtain high-resolution images of specimens through the employment of electron beams. Products include instruments utilizing several techniques, such as transmission and scanning, and microscope accessories and supplies.
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  • Electron Microscope Accessories (52)
    Combined Focused Ion Beam-Scanning Electron Microscopes (21)
    Transmission Electron Microscopes (18)
    Scanning Electron Microscopes (11)
    Desktop Scanning Electron Microscopes (10)
    Focused Ion Beam Electron Microscopes (8)
    Electron Microscopy Sample Preparation Systems (5)
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Helios 5 Hydra UX DualBeam Thermo Scientific™
The Thermo Scientific™ Helios 5 Hydra UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It combines the new, innovative multiple ion species PFIB column with the monochromated Thermo Scientific Elstar SEM Column to provide the most advanced focused ion- and...
Thermo Scientific™ Helios™ NanoLab 1200AT DualBeam™ can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter.
The Thermo Scientific™ Helios™ G4 HX DualBeam™ microscope replaces the highly successful Helios 460HP as the industry’s highest throughput, dedicated transmission electron microscope (TEM) lamella preparation platform.
The Thermo Scientific™ Phenom™ ParticleX scanning electron microscope (SEM) for additive manufacturing is a multi-purpose desktop SEM delivering purity at the microscale. Take in-house control of your data. Monitor critical characteristics of metal powders.
Phenom™ Pro Desktop SEM Thermo Scientific™
The sixth-generation of Thermo Scientific™ Phenom™ Pro G6 Desktop SEM fills the gap between light microscopy and floor-model SEM analysis, thus expanding the capabilities of research facilities. Fast and easy to use, the Phenom Pro G6 Desktop SEM can be used to relieve the burden of routine analysis...
Find additional information here: Thermo Scientific™ Krios™ G4 Cryo Transmission Electron Microscope (Cryo-TEM) The new Thermo Scientific™ Krios™ G4 Cryo Transmission Electron Microscope (Cryo-TEM) enables you to unravel life at the molecular level—easier, faster and more reliably than ever before.
Thermo Scientific™ Helios™ G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios G4 PFIB UXe is part of the fourth generation of the industry-leading Helios DualBeam family. It combines the new PFIB 2.
The new Thermo Scientific™ Apreo™ 2 SEM expands access to high-performance imaging and analytics to all levels of microscopy expertise. With Thermo Scientific™ ColorSEM Technology, a unique live elemental imaging capability, compositional information is always available, through the most intuitive...
The latest technological innovations of the Thermo Scientific™ Helios™ G4 DualBeam™, in combination with the easiest to use, most comprehensive software and Thermo Fisher Scientific's application expertise, allow for the fastest and easiest preparation of site-specific, ultra-thin HR-S/TEM samples...
Tundra Cryo-TEM Thermo Scientific™
The Thermo Scientific Tundra Cryo-Transmission Electron Microscope (Cryo-TEM) is a dedicated structure-determination solution designed to bring single particle analysis to every biochemistry laboratory.
The Thermo Scientific™ Talos™ F200S scanning/transmission electron microscope(S/TEM) combines outstanding high-resolution S/TEM and TEM imaging with industry-leading energy dispersive x-ray spectroscopy (EDS).
The Thermo Scientific™ Talos™ F200C transmission electron microscope (TEM) is a powerful, versatile system for delivering 3D characterization of biological and biomaterials samples in cell biology, structural biology, and nanotechnology research.
Arctis Cryo-Plasma-FIB Thermo Scientific™
Cryo-electron tomography (cryo-ET) provides unprecedented insights into the inner workings of cells, but clear, reliable results depend on high-quality cryo-lamella preparation. The Thermo Scientific Arctis Cryo-Plasma Focused Ion Beam (Cryo-PFIB) is specifically designed for automated,...
The Thermo Scientific™ Themis™ ETEM builds on the proven Titan ETEM concept-combining both standard S/TEM and dedicated environmental TEM capabilities for time-resolved, in situ studies of the dynamic behavior of nanomaterials.
Helios 5 EXL DualBeam Thermo Scientific™
TEM sample preparation with the Helios 5 EXL DualBeam FIB SEM is automated and wafer-based, enabling the analysis of advanced 5 nm semiconductor nodes and more.
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Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within many research fields, spanning everything from materials science and life sciences to forensics and industrial manufacturing.
Documents & Support (706)
Helios 6 HD FIB-SEM Datasheet
Brochure: State-of-the-art EDS