Electron Microscopes

Electron Microscopes

Electron microscopes are high-magnification microscopy instruments used to obtain high-resolution images of specimens through the employment of electron beams. Products include instruments utilizing several techniques, such as transmission and scanning, and microscope accessories and supplies.
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Phenom™ ParticleX AM Desktop SEM Thermo Scientific™

The Thermo Scientific™ Phenom™ ParticleX scanning electron microscope (SEM) for additive manufacturing is a multi-purpose desktop SEM delivering purity at the microscale. Take in-house control of your data. Monitor critical characteristics of metal powders.

Metrios™ TEM for Semiconductors Thermo Scientific™

Advanced logic and memory manufacturing processes are becoming more reliant on fast turnaround of precise structural and analytical data to be able to quickly calibrate tool sets, diagnose yield excursions, and optimize process yields.

Helios™ G4 PFIB CXe DualBeam™ FIB/SEM for Materials Science Thermo Scientific™

Thermo Scientific™ Helios™ G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios G4 PFIB CXe is part of the fourth generation of the industry-leading Helios DualBeam family. It combines the new PFIB 2.

Glacios™ Cryo-TEM for Life Sciences Thermo Scientific™

Find additional information here: Thermo Scientific™ Glacios™ Cryo Transmission Electron Microscope (Cryo-TEM) The new Thermo Scientific™ Glacios™ Cryo Transmission Electron Microscope (Cryo-TEM) delivers a complete and affordable Cryo-EM solution to a broad range of scientists.

Micro Tool Sample Holder Thermo Scientific™

Imaging long axial shaped samples without sample modification is possible with the Thermo Scientific™ Micro Tool Sample Holder. Imaging objects such as drill bits, milling tools and injection needles is fast and easy using the Micro Tool Sample Holder.

Motorized Tilt & Rotation Sample Holder Thermo Scientific™

Revealing the hidden treasures of all features on your sample is now possible with the Thermo Scientific™ Motorized Tilt & Rotation Sample Holder. Samples can have lines and holes, or have multi-layer structures.

Helios 5 EXL DualBeam Thermo Scientific™

TEM sample preparation with the Helios 5 EXL DualBeam FIB SEM is automated and wafer-based, enabling the analysis of advanced 5 nm semiconductor nodes and more.

Helios 5 PFIB UXe DualBeam Thermo Scientific™

Thermo Scientific™ Helios 5 PFIB UXe delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios 5 PFIB UXe is part of the fifth generation of the industry-leading Helios DualBeam™ family.

Helios™ G4 PFIB UXe DualBeam™ FIB/SEM for Materials Science Thermo Scientific™

Thermo Scientific™ Helios™ G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios G4 PFIB UXe is part of the fourth generation of the industry-leading Helios DualBeam family. It combines the new PFIB 2.

Helios™ 5 Laser PFIB Thermo Scientific™

Fastest high-quality sub-surface and 3D characterization at millimeter scale with nanometers resolution. The Thermo Scientific™ Helios™ 5 Laser PFIB delivers unmatched capabilities for extreme large-volume 3D analysis, Ga-free sample preparation, and precise micromachining.

Helios 5 UX DualBeam for Materials Science Thermo Scientific™

The Thermo Scientific™ Helios™ 5 UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column with high-current UC+ technology for extreme...

Helios G4 UC DualBeam for Semiconductors Thermo Scientific™

Scientists and engineers constantly face new challenges that require highly localized characterization of increasingly complex samples with ever smaller features. The latest technological innovations of the Thermo Scientific™ Helios™ G4 UC DualBeam™ microscope, in combination with the easiest to...

Phenom ParticleX Steel Desktop SEM Thermo Scientific™

The Phenom ParticleX Steel Desktop SEM is a combined SEM imaging and EDS analysis instrument for quality control in steel manufacturing, with industry-specific software designed to quickly and easily provide high-quality data for inclusion, fault, and failure analysis.

Scios™ 2 DualBeam™ for Materials Science Thermo Scientific™

The Thermo Scientific™ Scios™ 2 DualBeam™ is an ultra-high-resolution analytical FIB-SEM system that provides outstanding sample preparation and 3D characterization performance for the widest range of samples, including magnetic and non-conductive materials.

Phenom™ Pro Desktop SEM Thermo Scientific™

The sixth-generation of Thermo Scientific™ Phenom™ Pro G6 Desktop SEM fills the gap between light microscopy and floor-model SEM analysis, thus expanding the capabilities of research facilities. Fast and easy to use, the Phenom Pro G6 Desktop SEM can be used to relieve the burden of routine analysis...
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