Shop All Electrical Failure Analysis Systems (EFA)
Meridian™ 7 System for Semiconductors Thermo Scientific™
Hyperion™ System for Semiconductors Thermo Scientific™
The Thermo Scientific™ Hyperion II System offers fast, accurate transistor probing for electrical characterization and fault localization in support of semiconductor technology development, yield engineering and device reliability improvement. The unparalleled stability of the Hyperion II System enables nanoprobing down to the 10nm technology node and beyond. The Hyperion II System’s SPM technology enables PicoCurrent imaging, which is a technique to rapidly identify shorts, opens, leakage paths and resistive contacts with more than 1,000 times the sensitivity of passive voltage contrast. The scanning capacitance microscopy (SCM) module provides image-based fault localization for SOI wafers, as well as high-resolution dopant profiling.
Meridian™ IV System for Semiconductors Thermo Scientific™
Meridian-IV system is the preferred choice for developers of advanced, low-voltage, high-density semiconductor devices requiring best-in-class performance and the ability to diagnose wide ranging failure modes, including parametric failures and those resulting from design-process marginalities.
Capabilities include standard best-in-class InGaAs-based emission detection or High sensitivity extended-wavelength DBX-based emission detection; Patented, industry-proven "Point & Click" Solid Immersion Lens (SIL); Inverted platform for easy ATE direct docking; Compatibility with most popular third-party EDA applications; Optional laser scanning microscope (LSM) for static and dynamic analysis; Works easily with packaged parts and wafer/die backside samples; Optional 350x long working distance SIL.
Centrios Advanced Circuit Edit System for Integrated Circuits Thermo Scientific™
Meridian™ M System for Semiconductors Thermo Scientific™
Thermo Scientific™ Meridian™ M system system uses high sensitivity broadband DBX™ photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults. Given results from wafer sort / chip probe, the Meridian M system delivers localization suitable for nanoprobing or imaging techniques such as SEM or TEM.
Custom-designed optics, a set of user-selectable wavelength ranges and low background noise allow Meridian M to be optimized for a variety of routine or challenging fault types, like large-area process variation in advanced memory devices that leads to anomalous leakage; high resistivity wordline to wordline or bitline to bitline shorts within memory cells; resistive faults in low voltage GPUs and other low-voltage logic circuits; and any weakly emitting faults requiring long integration time.
The Meridian M system accommodates full wafers in addition to packaged die, allowing FA engineers to compare good die to bad die, aiding interpretation of complex emission images.
Capabilities include highest sensitivity emission detection, for low VDD and low leakage; advanced constant-current and constant-voltage Static Laser Stimulation (SLS) techniques; Ability to detect thermal faults, including challenging high-ohmic shorts and electromigration.
Meridian S Inverted Static Optical Fault Isolation System Thermo Scientific™
The Thermo Scientific™ Meridian™ S Inverted Static Optical Fault Isolation System enables Failure Analysis engineers in fabs and service labs to localize electrical faults in semiconductor devices. It offers high-sensitivity Static Laser Stimulation (IR-OBIRCH) and Photon Emission capabilities for the identification of electrical shorts and areas of leakage, in addition to the characterization of device activity via non-destructive analysis. The Meridian S System was designed for upgradability to higher sensitivity Photon Emission and Dynamic OFI techniques to maximize value and productivity.
Meridian™ WS-DP System for Semiconductors Thermo Scientific™
The Thermo Scientific™ Falcon™ 4 Direct Electron Detector is the ideal solution for your single particle analysis and cryo electron tomography needs. By combining a 10x shorter exposure time (as compared to the Falcon 3 Detector) with an improved detector quantum efficiency (DQE) over the entire spatial frequency range, the Falcon 4 Detector has a significantly increased internal framerate (250 fps), allowing you to collect the best quality images with the highest throughput possible. In fact, the unsurpassed DQE at low frequencies makes it ideally suited for small or difficult to detect proteins.
Meridian™ V System for Semiconductors Thermo Scientific™
Optimized dynamic LSM platform
- Performance optical path for best imaging
- Architecture supports automated test equipment (ATE) docking and back-side (B/S) analysis
- Mobility for the lab; high power cooling options
- Laser voltage probing (LVP) and laser voltage imaging (LVI) for timing and functional analysis
- Dynamic laser simulation (DLS) for critical path analysis
- Powerful and easy-to-use Sierra Software GUI
Dynamic electrical fault isolation
- Transistor- and cell-level fault localization
- Isolate design-process marginalities
- Based on Ruby optics