Helios 5 EXL DualBeam Thermo Scientific™
TEM sample preparation with the Helios 5 EXL DualBeam FIB SEM is automated and wafer-based, enabling the analysis of advanced 5 nm semiconductor nodes and more.
Filter Inserts Thermo Scientific™
Filter paper samples which are often used for filter residue analysis and asbestos analysis must be mounted firmly and flat into the SEM system for correct analysis. As filter paper is a delicate sample material, mounting these samples without the use of an insert can lead to folding and damaged...
Helios™ 5 Laser PFIB Thermo Scientific™
Fastest high-quality sub-surface and 3D characterization at millimeter scale with nanometers resolution. The Thermo Scientific™ Helios™ 5 Laser PFIB delivers unmatched capabilities for extreme large-volume 3D analysis, Ga-free sample preparation, and precise micromachining.
Helios 5 Hydra CX DualBeam Thermo Scientific™
The Thermo Scientific™ Helios 5 Hydra CX DualBeam is part of the fourth generation of the industry-leading Helios DualBeam family. It combines the new, innovative multiple ion species PFIB column with the monochromated Thermo Scientific Elstar SEM Column to provide the most advanced focused ion- and...
Phenom ParticleX Steel Desktop SEM Thermo Scientific™
The Phenom ParticleX Steel Desktop SEM is a combined SEM imaging and EDS analysis instrument for quality control in steel manufacturing, with industry-specific software designed to quickly and easily provide high-quality data for inclusion, fault, and failure analysis.
Phenom™ ParticleX AM Desktop SEM Thermo Scientific™
The Thermo Scientific™ Phenom™ ParticleX scanning electron microscope (SEM) for additive manufacturing is a multi-purpose desktop SEM delivering purity at the microscale. Take in-house control of your data. Monitor critical characteristics of metal powders.
Phenom™ ParticleX TC Desktop SEM Thermo Scientific™
The Thermo Scientific™ Phenom™ ParticleX scanning electron microscope (SEM) for technical cleanliness is a multi-purpose desktop SEM enabling cleanliness at the microscale. Take in-house control of your data. Up to 10 times faster than outsourcing.
Phenom™ Perception GSR Desktop SEM Thermo Scientific™
Gunshot Residue (GSR) analysis plays an important role in the determination if a firearm has been used in a crime. Established GSR analysis techniques are based on the use of a scanning electron microscope (SEM), which is used to scan the sample and find suspect GSR particles.
Axia™ ChemiSEM™ Scanning Electron Microscope Thermo Scientific™
The Thermo Scientific™ Axia™ ChemiSEM™ Scanning Electron Microscope is unlike traditional SEMs in that it always collects EDS data in the background. It uses unique algorithms to process the SEM and EDS signals simultaneously, allowing it to display the morphology and elemental makeup of a sample...
Helios 5 UX DualBeam for Materials Science Thermo Scientific™
The Thermo Scientific™ Helios™ 5 UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column with high-current UC+ technology for extreme...
Helios G4 UC DualBeam for Semiconductors Thermo Scientific™
Scientists and engineers constantly face new challenges that require highly localized characterization of increasingly complex samples with ever smaller features. The latest technological innovations of the Thermo Scientific™ Helios™ G4 UC DualBeam™ microscope, in combination with the easiest to...
Helios 5 PFIB UXe DualBeam Thermo Scientific™
Thermo Scientific™ Helios 5 PFIB UXe delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios 5 PFIB UXe is part of the fifth generation of the industry-leading Helios DualBeam™ family.
Helios™ G4 PFIB UXe DualBeam™ FIB/SEM for Materials Science Thermo Scientific™
Thermo Scientific™ Helios™ G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios G4 PFIB UXe is part of the fourth generation of the industry-leading Helios DualBeam family. It combines the new PFIB 2.
Helios™ NanoLab™ 1200AT DualBeam™ for Semiconductors Thermo Scientific™
Thermo Scientific™ Helios™ NanoLab 1200AT DualBeam™ can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter.
Talos F200E TEM Thermo Scientific™
The Thermo Scientific Talos F200E (Scanning) Transmission Electron Microscope provides high-resolution STEM and TEM imaging with minimal distortion, combined with high-throughput energy-dispersive X-ray spectroscopy (EDS) functionality, tailored for a wide range of semiconductor defect analysis and...