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Combined Focused Ion Beam-Scanning Electron Microscopes
Combined focused ion beam-scanning electron microscopes are microscopy systems that combine the capabilities of scanning electron and focused ion beam microscopy techniques. Products are suitable for life sciences, material science, and various other research or industry applications.
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Helios 5 Hydra UX DualBeam Thermo Scientific™
The Thermo Scientific™ Helios 5 Hydra UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It combines the new, innovative multiple ion species PFIB column with the monochromated Thermo Scientific Elstar SEM Column to provide the most advanced focused ion- and...
Aquilos™ Cryo-FIB for Life Sciences Thermo Scientific™
The Thermo Scientific™ Aquilos™ Cryo-FIB is the first cryo-DualBeam™ (focused ion beam/scanning electron microscope) system dedicated to preparation of frozen, thin lamella samples from biological specimens for high-resolution tomographic imaging in a cryo-transmission electron microscope...
Helios 5 UX DualBeam for Materials Science Thermo Scientific™
The Thermo Scientific™ Helios™ 5 UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column with high-current UC+ technology for extreme...
Scios™ 2 DualBeam™ for Materials Science Thermo Scientific™
The Thermo Scientific™ Scios™ 2 DualBeam™ is an ultra-high-resolution analytical FIB-SEM system that provides outstanding sample preparation and 3D characterization performance for the widest range of samples, including magnetic and non-conductive materials.
Helios™ G4 PFIB HXe DualBeam™ for Semiconductors Thermo Scientific™
The Thermo Scientific™ Helios™ G4 PFIB HXe DualBeam System provides unique capabilities to enable damage-free delayering of 10nm semiconductor devices and advanced failure analysis of 3D packages, in addition to a wide range of other large area FIB processing applications.
Arctis Cryo-Plasma-FIB Thermo Scientific™
Cryo-electron tomography (cryo-ET) provides unprecedented insights into the inner workings of cells, but clear, reliable results depend on high-quality cryo-lamella preparation. The Thermo Scientific Arctis Cryo-Plasma Focused Ion Beam (Cryo-PFIB) is specifically designed for automated,...
Helios 5 CX DualBeam for Materials Science Thermo Scientific™
The Thermo Scientific™ Helios™ 5 CX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column for ultra high-resolution imaging and the highest...
Aquilos 2 Cryo-FIB Thermo Scientific™
Find additional information here: Thermo Scientific™ Aquilos™ 2 Cryo-FIB The Thermo Scientific™ Aquilos™ 2 Cryo-FIB is the latest generation of our cryo-DualBeam system. It is dedicated to the preparation of thin, electron-transparent lamellas for high-resolution cryo-electron tomography or MicroED...
Helios 5 Hydra CX DualBeam Thermo Scientific™
The Thermo Scientific™ Helios 5 Hydra CX DualBeam is part of the fourth generation of the industry-leading Helios DualBeam family. It combines the new, innovative multiple ion species PFIB column with the monochromated Thermo Scientific Elstar SEM Column to provide the most advanced focused ion- and...
Helios™ G4 HX DualBeam™ for Semiconductors Thermo Scientific™
The Thermo Scientific™ Helios™ G4 HX DualBeam™ microscope replaces the highly successful Helios 460HP as the industry’s highest throughput, dedicated transmission electron microscope (TEM) lamella preparation platform.
Helios™ NanoLab™ 1200AT DualBeam™ for Semiconductors Thermo Scientific™
Thermo Scientific™ Helios™ NanoLab 1200AT DualBeam™ can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter.
Helios 5 UC DualBeam for Materials Science Thermo Scientific™
The Thermo Scientific™ Helios™ 5 UC DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column with high-current UC+ technology for extreme...
Scios™ DualBeam for Life Sciences Thermo Scientific™
With its unique, flexible detection scheme, the Thermo Scientific™ Scios™ DualBeam™ offers simultaneous detection of all information with excellent contrast at high acquisition speeds and high resolution at low kV.
Helios G4 UX DualBeam for Semiconductors Thermo Scientific™
The latest technological innovations of the Thermo Scientific™ Helios™ G4 DualBeam™, in combination with the easiest to use, most comprehensive software and Thermo Fisher Scientific's application expertise, allow for the fastest and easiest preparation of site-specific, ultra-thin HR-S/TEM samples...
Helios 5 PFIB UXe DualBeam Thermo Scientific™
Thermo Scientific™ Helios 5 PFIB UXe delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios 5 PFIB UXe is part of the fifth generation of the industry-leading Helios DualBeam™ family.
