Combined Focused Ion Beam-Scanning Electron Microscopes

Combined Focused Ion Beam-Scanning Electron Microscopes

Combined focused ion beam-scanning electron microscopes are microscopy systems that combine the capabilities of scanning electron and focused ion beam microscopy techniques. Products are suitable for life sciences, material science, and various other research or industry applications.
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The Thermo Scientific™ Helios™ 5 CX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column for ultra high-resolution imaging and the highest...
Helios 5 Hydra UX DualBeam Thermo Scientific™
The Thermo Scientific™ Helios 5 Hydra UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It combines the new, innovative multiple ion species PFIB column with the monochromated Thermo Scientific Elstar SEM Column to provide the most advanced focused ion- and...
The Thermo Scientific™ Aquilos™ Cryo-FIB is the first cryo-DualBeam™ (focused ion beam/scanning electron microscope) system dedicated to preparation of frozen, thin lamella samples from biological specimens for high-resolution tomographic imaging in a cryo-transmission electron microscope...
The Thermo Scientific™ Helios™ 5 UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column with high-current UC+ technology for extreme...
The Thermo Scientific™ Helios 6 HD FIB-SEM is designed to meet the industry need for higher volumes of high-quality TEM data for failure analysis and metrology. This latest addition to the Thermo Scientific family of industry standard DualBeam instruments is capable of manual or semi-automated TEM...
The Thermo Scientific™ Scios™ 2 DualBeam™ is an ultra-high-resolution analytical FIB-SEM system that provides outstanding sample preparation and 3D characterization performance for the widest range of samples, including magnetic and non-conductive materials.
The Thermo Scientific™ Helios™ 5 UC DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column with high-current UC+ technology for extreme...
Helios 5 Hydra CX DualBeam Thermo Scientific™
The Thermo Scientific™ Helios 5 Hydra CX DualBeam is part of the fourth generation of the industry-leading Helios DualBeam family. It combines the new, innovative multiple ion species PFIB column with the monochromated Thermo Scientific Elstar SEM Column to provide the most advanced focused ion- and...
Helios 5 PFIB CXe DualBeam Thermo Scientific™
Thermo Scientific™ Helios 5 PFIB CXe delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios 5 PFIB CXe is part of the fifth generation of the industry-leading Helios DualBeam™ family.
Arctis Cryo-Plasma-FIB Thermo Scientific™
Cryo-electron tomography (cryo-ET) provides unprecedented insights into the inner workings of cells, but clear, reliable results depend on high-quality cryo-lamella preparation. The Thermo Scientific Arctis Cryo-Plasma Focused Ion Beam (Cryo-PFIB) is specifically designed for automated,...
With its unique, flexible detection scheme, the Thermo Scientific™ Scios™ DualBeam™ offers simultaneous detection of all information with excellent contrast at high acquisition speeds and high resolution at low kV.
Thermo Scientific CryoFlow Software is a paperless data management solution that optimizes cryo-electron microscopy (cryo-EM) workflows for single particle analysis and cryo-electron tomography (cryo-ET).
Helios 5 PFIB UXe DualBeam Thermo Scientific™
Thermo Scientific™ Helios 5 PFIB UXe delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios 5 PFIB UXe is part of the fifth generation of the industry-leading Helios DualBeam™ family.
Aquilos 2 Cryo-FIB Thermo Scientific™
Find additional information here: Thermo Scientific™ Aquilos™ 2 Cryo-FIB The Thermo Scientific™ Aquilos™ 2 Cryo-FIB is the latest generation of our cryo-DualBeam system. It is dedicated to the preparation of thin, electron-transparent lamellas for high-resolution cryo-electron tomography or MicroED...
PFIB SEM for in-line metrology and process monitoring of advanced 3D NAND and DRAM devices.
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A plasma focused ion beam milling scanning electron microscopy (plasma-FIB SEM) combines improved sputtering efficiency with nanometer imaging resolution at either room temperature or under cryogenic conditions. This can provide fast-end pointing during 3D imaging.
Scientists and engineers in both academia and industry are constantly facing new challenges that require highly localized characterization of a wide range of samples and materials. The ongoing drive to improve the quality of these materials means that structural and compositional information at the...
Documents & Support (35)
Helios 6 HD FIB-SEM Datasheet
Brochure: FIB-SEM instruments for materials science